Local electrical characterization of two-dimensional materials with functional atomic force microscopy

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Front. Phys. ›› 2019, Vol. 14 ›› Issue (3) : 33401. DOI: 10.1007/s11467-018-0879-7
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Local electrical characterization of two-dimensional materials with functional atomic force microscopy

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{{article.zuoZheEn_L}}. {{article.titleEn}}. Front. Phys., 2019, 14(3): 33401 https://doi.org/10.1007/s11467-018-0879-7

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