Defect control during CVD-growth for high performance MoS2-based self-powered photodetector

Xinyue Pan , Zhe Xu , Jinhua Li , Kaixi Shi , Mingze Xu , Xuan Fang , Guannan Qu

Front. Phys. ›› 2025, Vol. 20 ›› Issue (2) : 024206

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Front. Phys. ›› 2025, Vol. 20 ›› Issue (2) : 024206 DOI: 10.15302/frontphys.2025.024206
RESEARCH ARTICLE

Defect control during CVD-growth for high performance MoS2-based self-powered photodetector

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Abstract

Two-dimensional (2D) transition-metal dichalcogenides (TMDs) materials have unique band structure as well as excellent electrical and optical properties, which exhibit great advantages in optoelectronic devices. Chemical vapor deposition (CVD), a method to realize the synthesis of large-scale 2D TMDs materials, will inevitably introduce defects in the growth process, thus decreasing the performance of 2D TMDs-based optoelectronic devices. In order to fundamentally address this issue, we proposed a method to gradually regulate the reaction concentration of precursor during growth. As a result, the suitable concentration of precursor can effectively enhance the probability of covalent binding of X−M (X: S, Se, etc.; M: Mo, W, etc.), thus suppressing the generation of vacancy defects. Furthermore, we explored sulfur vacancy (VS) on the performance of 2D molybdenum disulfide-based (MoS2-based) self-powered devices through constructing p-type silicon/MoS2 (p-Si/MoS2) based p–n heterojunction. The photodetector composed of optimized MoS2 nanosheets exhibited high responsivity (330.14 A·W−1), fast response speed (40 μs/133 μs), and excellent photovoltage stability. This method of regulating the low temperature region during CVD growth can realize the preparation of high-quality TMDs films and be applied in high-performance optoelectronic devices.

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Keywords

defect control / sulfur vacancy / chemical vapor deposition (CVD) / photodetector / transition-metal dichalcogenides (TMDs)

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Xinyue Pan, Zhe Xu, Jinhua Li, Kaixi Shi, Mingze Xu, Xuan Fang, Guannan Qu. Defect control during CVD-growth for high performance MoS2-based self-powered photodetector. Front. Phys., 2025, 20(2): 024206 DOI:10.15302/frontphys.2025.024206

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1 Introduction

Due to the advantages of tunable band gap (1–2 eV) [1, 2], strong light-matter interaction [3, 4] and ultrafast carrier transport [5], the 2D layered TMDs materials have been widely used in the field of the optoelectronic devices [6], such as phototransistors [710], solar cells [11, 12], and especially photodetection [1316]. At present, CVD is generally considered as the most promising method for the controlled large-scale synthesis of TMDs [1719]. However, according to the second law of thermodynamics, the defects are more likely to generate in TMDs synthesized by CVD method because of the unstable and low formation energy of defects during the reaction. The presence of defects in TMDs-based heterojunctions can decrease the performance of optoelectronic devices, such as responsivity, response speed, and photovoltage stability. Therefore, it is of great significance to study how to suppress the generation of defects to some extent and decrease the negative impact of defects on optoelectronic devices.

The defects in TMDs include vacancies, impurities, attached atoms, etc. [20], among which vacancy defects are the most stable structural defects. In order to efficiently repair the vacancy defects, most studies have focused on post-treatment. Post-treatment refers to processes of treating TMDs film grown on the substrate. The main method is surface passivation treatment [2126], which can fill vacancy defects with oxygen(O)/sulfur(S)/other atoms to repair the surface overhanging bonds of materials. It is considered as an effective method to improve the performance of devices. For example, Lee et al. [21] used O plasma to heal VS, improving the channel quality and mobility of FETs. Gao et al. [22] efficiently repaired VS by annealing under S vapor after CVD growth. Schwarz et al. [23] healed VS using chemical thiol reagents adsorption at active vacancy sites. Above methods can only repair the defects on the surface of TMDs, while the defects inside the material are not treated. In fact, most post-treatment methods not only require complex processes, but also increase the preparation cost and are extremely easy to damage the surface. Therefore, it is crucial to study how to suppress the generation of vacancy defects during the preparation stage of growth. We took the growth of MoS2 as an example. Zhou et al. [27] discussed the relationship between formation energy of point defects and the S chemical potential, and found that the formation energy of VS is the lowest regardless of the environment rich in S or Mo. Therefore, the VS is the most easily formed vacancy defect during CVD growth. Many reports have altered the growth environment [2831] during CVD growth to suppress the production of VS, such as regulating growth temperature, turning pressure, and using single-phase precursors. For example, Tomar et al. [28] explored the effect of growth temperature in high temperature region on the morphology and vacancy defects of MoS2 film. Abidi et al. [29] altered the pressure to suppress the generation of VS during growth. Mawlong et al. [30] introduced additional DMS in the liquid-phase precursor to create a S-rich environment that suppressed VS formation, but additional chemical solution is very likely to introduce impurities. However, it is unknown whether the higher concentration of S source will synthesize MoS2 nanosheets with larger size and lower VS density. Therefore, it is necessary to systematically discuss the dependence of precursor concentration on the growth of 2D-MoS2 nanosheets and its application in optoelectronic devices.

In this work, we proposed a method to gradually regulate the reaction concentration of precursor during CVD growth. Furthermore, the MoS2 nanosheets were transferred to p-Si substrates to form p-Si/MoS2 heterojunction photodetectors, which realized self-powered characteristics. Interestingly, too low temperature of S source cannot drive the reaction completely, and too high temperature of S source will lead to undesired nucleation and growth due to ultra-high S chemical potential. The appropriate S source temperature can effectively enhance the probability of Mo–S covalent binding and suppress the generation of VS, which facilitates reaction to synthesize high-quality MoS2 nanosheets. This contributes to light absorption and efficient photocarriers separation of interface for the application in the high-performance p-Si/MoS2 self-powered photodetector.

2 Experimental

2.1 Preparation of MoS2 nanosheets

The double temperature zone tube furnace (KTL1700-1400, Nanjing University instrument factory) was used to grow MoS2 nanosheets. 200 mg S powder (99.98%, Aldrich) and 50 mg MoO3 powder (99.5%, Aldrich) were used as precursors. The temperature in the low temperature zone was set at 150–180 °C to create a different concentration of S vapor environment, and the temperature in the high temperature zone was 700 °C, and the reaction was maintained for 60 minutes. The reaction was carried out in an Ar gas environment with a flow rate of 15 sccm.

2.2 Photodetector fabrication

The p-Si/MoS2 self-powered photodetector was constructed by transferring MoS2 nanosheets onto p-Si by wet transfer technology. A small amount of PMMA solution (about 20 µL) was dripped onto MoS2/SiO2/Si substrate surface and placed into a Spin Coater (4000 r/min for 30 s). Place it on the heating platform to dry at 80 °C for 5 min, and then keep it at 150 °C for 15 min (so that PMMA and MoS2 were fully integrated). The PMMA/MoS2 layer was separated from the substrate by placing the substrate in a NaOH aqueous solution (30%). Then the PMMA/MoS2 layer was washed in ultra-pure water to remove the remaining NaOH, and fished out with p-Si substrate. Place it again on the Heating Platform (80 °C for 5 min, and then 150 °C for 15 min). Then, PMMA/MoS2/p-Si substrate was placed in an acetone solution to remove PMMA and it was cleaned by immersion in absolute ethanol and dry the sample.

2.3 Characterizations

The size of MoS2 nanosheets grown at different temperatures of S source was evaluated under an optical microscope (DM4000, Germany). The number of growing MoS2 layers was confirmed by Raman spectrometer (labRAM HR Evolution) with a 532 nm linearly polarized light. The photoluminescence test was used to evaluate the defect content. X-ray diffractometry (D8 Focus, Germany) was used to judge the phase constituent of MoS2 nanosheets. The current–voltage (IV) test system included a Keithley 2400 digital source meter, white light laser (GTEBL-01), and probe station (EPS-300). The laser with a wavelength of 532 nm was focused through the lens and irradiated on the surface of the device. The pulsed photovoltaic response test system mainly included an oscilloscope (Tektronix MDO3032), white light laser (GTEBL-01), optical chopper (SR540), and probe station (EPS-300). The wavelength of light was 532 nm, and the frequency and power density of the chopper were 2000 Hz and 180 mW·cm−2, respectively. The system was used to evaluate the response speed of the device.

3 Results and discussion

Fig.1(a) shows an experimental process of CVD method to grow MoS2 materials. We used double temperature zone tube furnace to precisely control the temperature of MoO3 powder and S powder precursors, respectively. The redox reaction equation for MoS2 synthesized by CVD method is as follows:

7S2+4M oO34 M oS2+6S O2.

We controlled the temperature of S precursor by regulating low temperature zone, creating different S vapor concentrations in the MoS2 growth process. Specifically, MoO3 powder is first reduced by S vapor, forming volatile MoO3−x. Further, the partially reduced MoO3−x is transported downstream by high-purity Ar carrier gas, which adsorbed and diffused on the surface of the Silicon dioxide (SiO2) substrate. Finally, the MoO3−x will be further reduced by the S vapor near the substrate, thus obtaining the MoS2 nanosheets. During the chemical synthesis of MoS2, the stability of crystal growth will be also affected by too high or too low concentration of S vapor. The following experimental part will be discussed in depth. Fig.1(b) illustrates the formation process of VS in MoS2 nanosheets by CVD growth. In order to ensure sufficient supply of S source, we used 200 mg S and 50 mg MoO3 for the condition that the ratio of Mo:S is less than 1:2. We start from a hexagonal nucleation to discuss the growth process of MoS2 nanosheets. The three sides of the hexagonal nucleus are the zigzag ends of Mo atom, and the other three sides are the zigzag ends of S atom. In an abundant S supply environment, the energy of S atomic edge is more stable than the Mo atomic edge. The unsaturated Mo atoms with two hanging bonds are easier to meet and bond with free S atoms, which promotes the hexagonal nucleus to grow into triangular MoS2 nanosheets with S edge. In this process, the concentration of S vapor directly determines the driving speed of the redox reaction, which becomes the key to the growth of MoS2 as to the reaction equation (1). Ultra-low concentration of S vapor cannot drive the forward reaction completely, while ultra-high concentration of S vapor leads to too fast reaction speed, causing the energetic instability and irregular crystal growth. In order to create the optimal local chemical environment rich in S vapor and grow high-quality MoS2 nanosheets, we deliberately controlled the temperature of S source in the low temperature zone from 150 to 180 °C, including six temperature states, as shown in Fig.1(c).

Fig.2 shows the optical images of MoS2 nanosheets grown on the SiO2/Si substrates at different temperatures of S source. The growth process of MoS2 depends on the Gibbs free energy of the reaction associated with the S chemical potential, such as nucleation, aggregation, and self-assembly. As elaborated by the following observation: (i) When the temperature of S source was 150 °C, black particles can be seen on the substrate surface, which is identified as not fully sulfurized MoO3−x by Raman [See Fig. S1 in the Electronic Supplementary Materials (ESM)]. Due to the ultra-low concentration of S vapor will lead to the low S chemical potential, there is insufficient energy to overcome the barrier to initiate nucleation and growth of MoS2. (ii) The high S chemical potential (i.e., the S-rich chemical environment) is more favorable to drive the reaction of MoS2 by CVD method. It can promote the Mo atoms easier bonding with the surrounding free S atoms, increasing the probability of Mo−S covalent binding, thus speeding up the reaction rate. According to the principle of crystal growth, the growth rate of the crystal surface determines the shape and size of crystal [32]. When the temperature of S source was increased from 160 to 170 °C, the majority size of MoS2 nanosheets was doubly enlarged. This phenomenon reflects that MoS2 is easier to overcome the barrier of nucleation and agglomeration with the increase of concentration of S vapor. Besides, high S chemical potential will facilitate the growth of high-quality MoS2. The following Raman, X-ray diffraction (XRD) and photoluminescence (PL) will further verify the defect density regulated by S vapor concentration. (iii) When the growth temperature reaches 175 °C and 180 °C, the energy in the reaction process is unstable due to ultra-high S chemical potential, leading to the undesired nucleation and growth of MoS2 nanosheets. The introduction of the defect state can be attributed to the fact that the growth rate of Mo edge is much faster than that of S edge, making the growth energy of the whole MoS2 crystal unstable. In summary, when the temperature of S source ranges from 160 to 170 °C, it is more conducive to the growth of large-scale and ultra-thin MoS2 nanosheets. The application of MoS2 nanosheets with different defect densities to optoelectronic devices will be discussed in the following sections.

In order to investigate the influence of temperature on sample crystal quality, we used Raman and XRD to characterize MoS2 nanosheets grown at the temperature of S source ranging from 160 to 170 °C. Fig.3(a) shows the Raman spectra of MoS2 nanosheets. Two sharp and strong peaks were detected, corresponding to the in-plane vibration mode E2g1 and the out-of-plane vibration mode A1g, respectively. The wave difference of A1gE2g1 Raman peak at 160 °C, 165 °C, and 170 °C is 21.91 cm−1, 21.14 cm−1, and 20.36 cm−1, respectively (See Fig. S2 in the ESM), suggesting that the MoS2 is bilayer [33]. Fig.3(b) shows the full width at half maxima (FWHM) for the three sets of MoS2 nanosheets. As the temperature of S source increases, the FWHM of the E2 g1 and A1g mode become narrower and the fluctuation of the statistical average is smaller, indicating that the crystallization quality of the MoS2 nanosheets was significantly improved [34]. Fig.3(c)–(e) show the XRD patterns for MoS2 nanosheets grown at different temperatures of S source. Compared with the Powder Diffraction File (PDF) card [Fig.3(f)], the XRD pattern has six diffraction peaks when the temperature of S source is 170 °C, corresponding to the (002), (004), (100), (104), (110), and (112) lattice planes, respectively. At the same time, the peaks are significantly sharper, which verifies the high crystal quality of MoS2 nanosheets. As the temperature of S source decreases, some diffraction peaks of MoS2 nanosheets are difficult to detect. It further confirmed that the suitable S vapor concertation contributed to the growth of MoS2 nanosheets with high crystal quality.

To evaluate the effect of VS on the PL of MoS2 nanosheets, PL spectra of three samples were compared, as shown in Fig.4(a). As the temperature of S source increases, the intensity of PL peak enhances and blueshift occurs. In the process of photoexcitation, MoS2 nanosheets absorb photon energy and generate excitons inside. Excitons have three main channels in the process of recombination luminescence. Intrinsic luminescence of A and B excitons is produced by splitting of the spin orbit of the high price band. The VS defect trapping excitons cause the VS defect state luminescence. Therefore, the Gaussian fitting was performed for the PL signal to verify the mechanism behind it, as shown in Fig.4(b). Among them, dark blue, light blue and green regions correspond to VS defect state PL peak (IVs), A exciton PL peak (IA), and B exciton PL peak (IB), respectively. As the temperature of S source increases, the area of A excitons PL peak gradually occupies whole spectrum. In order to further quantify the change of PL intensity of three components, the variation trend of PL intensity is shown in Fig.4(c), and the inset shows the percentage of VS defect state in the total spectrum. It can be clearly seen that the ratio of the area occupied by the VS PL peak to the total area of the whole spectrum gradually decreases. This result confirms that the VS density associated with defect state decreases as the temperature of S source increases. In essence, the formation energy of VS is directly related to the supply of S source or Mo source. The higher S source temperature leads to higher S chemical potential, resulting in higher VS formation energy [27]. Therefore, VS is not easy to form when the temperature of S source is 170 °C. For the MoS2 nanosheets with optimized VS density, the PL intensity associated with A and B excitons is enhanced by 10 times and 2 times, respectively. The reason for the enhancement of intrinsic luminescence is that the reduction of VS density will reduce the number of excitons trapped by the defect state, thus enhancing the efficiency of radiative recombination luminescence for intrinsic excitons [35]. Meanwhile, PL blueshift is ascribed to the upward shift of the valence band maximum caused by VS defect state, leading to the band gap reduction of MoS2 [36].

Fig.5(a) shows the schematic diagram of the current–voltage (IV) response test system. Fig.5(b) shows the energy band diagram of p-Si/MoS2 based p–n junction under light irradiation. The built-in field is induced by the electric potential difference between MoS2 and p-Si. The built-in field makes the device generate photogenerated electromotive force to realize the self-powered characteristics [37]. Fig.5(c) shows IV characteristic curves of optimized p-Si/MoS2 self-powered photodetector, which exhibits excellent rectification characteristics in dark state. As the light power density increases, the forward current of the p-Si/MoS2 self-powered photodetector remains essentially unchanged, while the reverse current is significantly enhanced. This situation is consistent with the typical properties of photovoltaic photodetectors [38]. Fig.5(d) shows the dependence of photocurrent on the light power density. The qualitative relationship between light power density and photocurrent is

Iph=CPβ,

where Iph, C, and P represent the photocurrent, the coeffcient of proportionality, and the light power density, respectively. With the increase of light power density, the photocurrent (Iph = IλIdark) of three p-Si/MoS2 self-powered photodetectors increases. The value of β reflects the defect density of film, and the closer to 1, the lower the defect content. The optimized p-Si/MoS2 photodetector has the highest β value (0.98), indicating an ultra-low defect density. This means that more photogenerated electron–hole pairs can be converted into photocurrent, rather than being trapped by the defect states of interface. Therefore, the optimized photodetector exhibits excellent photoresponse characteristics. Fig.5(e) shows the dependence of responsivity (R) on light power density. Its formula can be expressed as

R= Iph /(P ×S),

where P and S represent the light power density and the effective photovoltage response area of light irradiation, respectively. The optimized photodetector shows the highest responsivity of 330.14 A·W−1, which realizes 23 times enhancement compared to the photodetector with high VS density. This is because low VS density will reduce the number of trapped excitons, thus enhancing the light absorption of the material. Besides, high contact quality of the heterojunction interface will also suppress the recombination of photocarriers. The detectivity (D*) of three self-powered photodetectors was evaluated, as shown in Fig.5(f). The calculation formula of detectivity is

D= S1 /2R( 2qIdark) 1/ 2,

where R is responsivity, Idark is the dark current, and q is the unit charge. The p-Si/MoS2 self-powered photodetectors with the lowest VS density exhibited the highest detectivity, with a maximum of 1.0×1010 Jones.

Furthermore, the response speed of the p-Si/MoS2 self-powered photodetector was evaluated by laser-pulse test system without power supply, as shown in Fig.6(a). Fig.6(b) shows photovoltage response characteristic curves of p-Si/MoS2 self-powered photodetectors with different VS densities. The p-Si/MoS2 photodetector constructed with the lowest VS density has the strongest self-powered capability, which is consistent with the above photoresponse test results. A single photovoltaic response signal was extracted and normalized, as shown in Fig.6(c). We further discussed the dependence of photovoltage and response time on VS density, as shown in Fig.6(d). Usually, high photovoltage takes more time to respond. Interestingly, we found that the p-Si/MoS2 self-powered photodetector with the lowest defect density exhibits the highest photovoltage, together with the fastest response speed. This can be attributed to the high quality of heterojunction interfaces promoting the separation of photocarriers.

To further evaluate the effect of VS on the photovoltage stability, three photodetectors constructed with different VS densities were exposed to an environment with 31% humidity treatment for half an hour. Fig.7(a) shows Raman spectra of three photodetectors with different VS densities after treatment in humidity. In contrast to the E2 g1 vibration mode, the A1g vibration mode is sensitive to electrons [39], so we focused on the blue shift in A1g. When the temperature of S source is 160 °C, the blue shift of A1g peak positions is the largest (1.9 cm−1). This implies that the largest number of lost electrons from defects is due to the adsorption of water and oxygen [40], and the defect density is the highest. Fig.7(b)–(d) show comparison of photovoltage stability of three p-Si/MoS2 self-powered photodetectors before and after treatment in humidity environment. As the VS density increases, the attenuation of the photovoltage for three sets of samples gradually increases, namely: 6.7%, 10.5% and 43.9%, respectively. Thus, the optimized p-Si/MoS2 self-powered photodetector exhibits the most excellent photovoltage stability. When p-Si/MoS2 self-powered photodetector is placed in humidity environment, the water and oxygen molecules initially undergo chemisorption at the VS, and physisorption occurs on the upper layer [4143]. Chemisorption causes water or oxygen to bond with Mo/S atoms, extracting electrons from MoS2 and reducing the carrier concentration of MoS2 [40]. Physisorption causes incident light to be refracted by the surface of water molecules, reducing the absorption of light by the material. Meanwhile, the physisorbed water molecules produce an amount of hydronium ions (H3O+), which reduces the height of the interface barrier [44]. This further weakens the strength of the built-in electric field. The photocarriers cannot be effectively separated and the migration speed of photocarriers is slowed down. Therefore, the photoelectric conversion efficiency of the photodetector is affected by the humidity treatment, which determines the photovoltaic stability.

Above all, compared with the recently reported 2D TMDs-based self-powered photodetectors, our device exhibited high photoresponse and fast response speed (Tab.1).

4 Conclusion

In summary, we proposed a method to gradually regulate the reaction concentration of precursors during CVD growth to suppress the generation of vacancy defects in TMDs materials. Different from previous reports, we found that the suitable concentration of S precursor contributed to the growth of MoS2 nanosheets with low density of VS. As a result, the MoS2 grown at the S source region 170 °C has the lowest VS density that can be confirmed by Raman, PL, and XRD. Moreover, the optimized MoS2 nanosheet was applied to the high-performance self-powered photodetector, which realized high responsivity (330.14 A·W−1), fast response speed (40 μs/133 μs), and excellent photovoltage stability after being exposed to 31% humidity treatment. This study provides an avenue for defect regulation and material optimization of other TMDs, which is helpful for application in high-performance photodetectors.

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