Interfacial properties of 2D WS2 on SiO2 substrate from X-ray photoelectron spectroscopy and first-principles calculations

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Front. Phys. ›› 2022, Vol. 17 ›› Issue (5) : 53500. DOI: 10.1007/s11467-022-1167-0
RESEARCH ARTICLE

Interfacial properties of 2D WS2 on SiO2 substrate from X-ray photoelectron spectroscopy and first-principles calculations

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