1 Introduction
Thin films of [111]-oriented perovskite oxides ABO
3 (where A and B are metal cations) have attracted extensive attention of late because of their peculiar physical properties [
1–
3], such as the fact that the six-fold symmetry of their honeycomb structure can result in novel topology states at their surfaces or interfaces [
4,
5]. In addition, [111]-oriented superlattices allow for the design and construction of long-range ordering of cation dopants. One example of this is the double perovskite La
2FeCrO
6 structure with B site cations (Fe and Cr) distributed alternatively along the
direction that has been obtained by growing a LaFeO
3/LaCrO
3(111) superlattice [
6,
7], which was found to have magnetic properties distinctly different from a disordered solid solution of LaFeO
3 and LaCrO
3. An exchange bias has also been unexpectedly discovered [
8] in the [111]-oriented superlattice of paramagnetic LaNiO
3 and ferromagnetic LaMnO
3. Meanwhile, in the perovskite AMnO
3 manganite, A-site doping has been proven effective in tuning the properties of the material by inducing a rich phase diagram that includes colossal magnetoresistance and ferromagnetism [
9,
10]. Normally, these cation dopants are randomly distributed and produce a localization effect that reduces the metallicity of electron transport in low-dimensional manganite structures; this is one of the possible reasons for the so-called “deadlayer” problem in La
2/3Sr
1/3MnO
3 ultrathin films [
11]. Thus, a [111]-oriented LaMnO
3/SrMnO
3 superlattice in which La and Sr are distributed alternatively with long-range ordering along all
directions offers a realistic potential to solve this problem by suppressing the localization effect originating from A-site disorder.
It is quite challenging to grow perovskite (111) thin films due to their strong surface polarity and the multiple competing phases in the lattice structure. For example, SrMnO
3 is commonly synthesized in either cubic (C) or hexagonal (4H) structures (Fig. 1), both of which are antiferromagnetic insulators with respective Neel temperatures (
of 240 and 280 K [
12–
14]. The 4H-SrMnO
3 structure is made up of alternating face-sharing and corner-sharing MnO
6 molecules along the [0001] orientation [Fig. 1(b)], which contribute to long-range antiferromagnetic ordering [
13–
15]. The lattice structure of C-SrMnO
3, on the other hand, is quite simple [Fig. 1(a)], though first-principles calculations have shown that strain could produce a multiferroic phase due to its strong spin–phonon coupling [
16]. It is important to control the phase of SrMnO
3 during its growth, as otherwise, its properties can be quite varied. The stability of the perovskite structure can generally be described by the tolerance factor:
where
r represents the ionic radii of A and B cations, and O atoms. For SrMnO
3 the value of
t is 1.04, meaning that the 4H phase is normally stable at room temperature and ambient pressure [
17], whereas the cubic phase can only be obtained in a metastable state [
13,
15]. In 1970, Negas and Roth [
18] presented a phase diagram for bulk SrMnO
3-x that demonstrated 4H-SrMnO
3 is stable in air up to about 1035
∘C. Higher temperatures were shown to induce the formation of oxygen vacancies (
, resulting in a deformation of the 4H phase that causes the crystal to transform into a perovskite-like structure at ¿1400
∘C. By annealing in air at 300
∘C for several hours, this perovskite-like SrMnO
3 was oxidized to form the cubic phase [
13–
15,
19].
For thin film growth, 1400
∘C is an impractically high temperature and is likely to deteriorate the desired [111]-oriented superlattice by causing serious interdiffusion across the interfaces. With a perovskite (001) substrate, the growth of a 4H-SrMnO
3 film can be suppressed by the symmetry mismatch, allowing the cubic phase to be obtained by pulsed laser deposition (PLD) at a reduced temperature of 800
∘C [
20]. Conversely, with a perovskite (111) surface, the competition between 4H (0001) and cubic (111) cannot be tuned by symmetry alone. This paper therefore looks at introducing an appropriate strain to the heteroepitaxial growth of SrMnO
3 films by using SrTiO
3(111) as the substrate. These single-crystalline SrMnO
3 films are grown by PLD as either a 4H or cubic phase depending on the growth parameters used. In this way, a C-SrMnO
3(111) film can be obtained at a temperature as low as 875
∘C, which represents a significant reduction when compared to bulk synthesis. This interface epitaxial stabilization also ensures that a C-SrMnO
3 film grown on SrTiO
3(111) has a good thermostability.
2 Experiments
Films of SrMnO
3 were deposited on Nb-doped (0.7 wt.%) SrTiO
3(111) single-crystalline substrates (3×12×0.5 mm
by ultra-high vacuum PLD using a 248 nm KrF excimer laser (CompexPro201F). Prior to deposition, the substrates were treated by Ar
+ ion sputtering (10 μA/1 KV) for 10 minutes followed by annealing at 900
∘C under 3×10
-6 mbar of oxygen pressure for 1 hour. This resulted in a 4×4 surface reconstruction with a slight Sr accumulation, which effectively stabilizes the SrTiO
3(111) polar surface [
21]. The samples were then heated by passing a direct current through the substrates, during which time the temperature was monitored by an infrared pyrometer. All depositions were carried out using a laser repetition rate of 2 Hz and an energy density of 1.5 J/cm
2. To control the phase of the SrMnO
3 film, the substrate temperature (
and oxygen pressure (
were adjusted to within 850–1000
∘C and 2×10
-6–5×10
-3 mbar, respectively. The film thickness was
60 nm for all samples, based on which it is considered reasonable to exclude any effect of substrate surface reconstruction on the film growth. The samples were post-annealed in a tube furnace at 300
∘C under an oxygen flow of
1 bar to minimize the oxygen vacancies formed. The crystalline structure of the film was characterized by X-ray diffraction (XRD) using an UltimaIV X-ray diffractometer with Cu K radiation (
Å). The DC magnetic susceptibilities were measured between 400 and 10 K by a commercial SQUID-vibrating sample magnetometer (Model S-VSM of Quantum Design) with zero-field cooling.
3 Results and discussion
The structure of the SrMnO
3 films produced on SrTiO
3(111) substrates was controlled to be either a 4H or cubic phase by changing the
and
during growth. Figure 2 shows the XRD spectra of samples deposited at 920
∘C/3.3×10
-5 mbar and 950
∘C/4.0×10
-3 mbar, in which the their different phases can be clearly distinguished. That is, if the diffraction peaks of the substrate are ignored, then one sample shows sharp peaks at
and 89.03
∘ that correspond to the (111) and (222) lattice plane interspacings of C-SrMnO
3 (JCPDS Card No. 231413) [
22] respectively, while the other shows peaks at
and 61.37
∘ that can be attributed to the (0002) and (0006) interspacings of the 4H phase (JCPDS Card No. 841612) [
13], respectively. No other diffractions are detected, indicating that monophased single-crystalline C- or 4H-SrMnO
3 films were obtained.
Table 1 summarizes the XRD data of samples grown under different and conditions, and indicates that a high and low favor the formation of the cubic phase, while a low and high lead to a 4H phase. This can be understood through thermodynamic analysis by considering the competition between the 4H and cubic phases to be a chemical process of
Oxygen vacancies are involved here since previous study of bulk SrMnO
3 has shown them to play a key role in the deformation of 4H-SrMnO
3 at temperatures above 1400
∘C [
18]. In the present study, the
s density during film growth is controlled by adjusting
, and the
and
required for transformation from 4H- to C-SrMnO
3 should follow the relation [
23]:
where
bar is the standard pressure,
is the standard enthalpy change (independent of
,
R is the ideal gas constant,
n is the total particle number, and
C0 is a constant. The boundary between C- and 4H-SrMnO
3 should therefore appear as a straight line in a phase diagram plot of
vs. lg
[
24], and the slope of this line should be negative given that
[
25,
26]. As shown schematically in Fig. 3, reducing the growth temperature of the C-SrMnO
3 film should be accompanied by a decrease in oxygen pressure; the minimum value being limited by the oxidation requirements of oxide growth. Putting the experimentally determined values of
and
needed to grow C- and 4H-SrMnO
3 films into the
vs.
plot, we find that these two phases are indeed separated by a straight line that is consistent with Eq. (2). It is also worth noting here that as the 4H phase is thermodynamically stable, it is reasonable to assume that the growth parameters of the cubic phase would be close to this boundary.
The temperature and
required for the transformation between cubic and 4H phases in the bulk material (1400
∘C / 0.2 bar) [
18] are also labeled in Fig. 3; and as can be seen, both these parameters fall well below the line for film growth. This indicates that the growth of C-SrMnO
3(111) film is possible at lower temperatures than those prescribed by thermodynamics. In the SrMnO
3/SrTiO
3 heteroepitaxial structure, any interface strain induced by the lattice mismatch must also be considered. The in-plane lattice mismatch between C-SrMnO
3 (space group
,
Å) and the SrTiO
3 substrate (space group
,
Å) is 2.655%, but drops to 1.443% when 4H-SrMnO
3(0001) (space group
,
Å,
Å) is grown on SrTiO
3(111) (see Fig. 1). When formed on SrTiO
3(111), either phase of SrMnO
3 will experience a compressive strain along its growth direction, but this is expected to be much larger in the case of the cubic phase due to its greater in-plane lattice mismatch. The experimentally observed vertical strain; which is defined as
, where
d is the lattice interspacing determined by XRD and
is the standard JCPDS card value (No. 231413 [
22] and No. 841612 [
13]) of the according interspacing; does not, however, show any significant difference between the two phases (Table 1). This may be attributed to the different lattice response of the [111] direction to distortion along
in the cubic phase when compared to the response of the [0001] direction to distortion along
in the 4H phase. Consequently, the stability of the cubic phase is enhanced at the heterointerfaces, allowing film growth at lower temperatures.
Figure 4 shows the susceptibility
χ of the cubic and 4H phase films at temperatures of between 10 and 400 K. Both curves exhibit antiferromagnetic phase transitions, with a
at 38 K and 41 K for the C- and 4H-SrMnO
3 films, respectively. The existence of defects or domain boundaries in the films might be the reason for this being lower than their respective bulk materials [
27].
The thermostability of the C-SrMnO3 film was evaluated by annealing it at 800 ∘C for 8 hours under an oxygen flow of 1 bar. As shown in Fig. 5, the XRD peaks corresponding to the cubic lattice structure showed no decay or displacement after annealing, indicating that no impurities were formed and the transformation to a 4H phase was inhibited. It is clear from this that thanks to the stabilizing effect of the heteroepitaxial interface cubic-SrMnO3 films should be capable of surviving conditions typical of oxide film growth. They therefore have the potential to provide a reliable template for the design and construction of artificial perovskite superlattices.
4 Conclusion
High-quality SrMnO3 films have been successfully grown on SrTiO3(111) substrates as either a cubic or 4H phase, the resulting structure being controlled by the substrate temperature and oxygen pressure during PLD growth. Following the principal of thermodynamics, the growth temperature of the cubic SrMnO3(111) film is significantly lowered by the strain that is induced by the lattice mismatch at the heterointerfaces. This enhances the thermostability of the cubic-SrMnO3 film, giving it the potential to be used for consistent growth of artificial perovskite superlattices.