Extending the trapping lifetime of single atom in a microscopic far-off-resonance optical dipole trap

Jun HE , Bao-dong YANG , Yong-jie CHENG , Tian-cai ZHANG , Jun-min WANG

Front. Phys. ›› 2011, Vol. 6 ›› Issue (3) : 262 -270.

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Front. Phys. ›› 2011, Vol. 6 ›› Issue (3) : 262 -270. DOI: 10.1007/s11467-011-0179-y
RESEARCH ARTICLE

Extending the trapping lifetime of single atom in a microscopic far-off-resonance optical dipole trap

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Abstract

In our experiment, a single cesium atom prepared in a large-magnetic-gradient magneto–optical trap (MOT) can be efficiently transferred into a 1064-nm far-off-resonance microscopic optical dipole trap (FORT). The efficient transfer of the single atom between the two traps is used to determine the trapping lifetime and the effective temperature of the single atom in FORT. The typical trapping lifetime has been improved from ~ 6.9 s to ~ 130 s by decreasing the background pressure from ~ 1 × 10–10 Torr to ~ 2 × 10–11Torr and applying one-shot 10-ms laser cooling phase. We also theoretically investigate the dependence of trapping lifetimes of a single atom in a FORT on trap parameters based on the FORT beam’s intensity noise induced heating. Numerical simulations show that the heating depends on the FORT beam’s waist size and the trap depth. The trapping time can be predicted based on effective temperature measurement of a single atom in the FORT and the intensity noise spectra of the FORT beam. These experimental results are found to be in agreement with the predictions of the heating model.

Keywords

magneto–optical trap (MOT) / far-off-resonance optical dipole trap (FORT) / single atom / trapping lifetime / release-and-recapture method (R&R) / effective temperature

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Jun HE, Bao-dong YANG, Yong-jie CHENG, Tian-cai ZHANG, Jun-min WANG. Extending the trapping lifetime of single atom in a microscopic far-off-resonance optical dipole trap. Front. Phys., 2011, 6(3): 262-270 DOI:10.1007/s11467-011-0179-y

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