Introduction
Design of CE–MIP torch
Fig.2 Design of a divergent nozzle with microfluidic channels for the injection of secondary gases. (a) Schematic of the CE–MIP torch; (b) cross-section of the bespoke nozzle; (c) CE–MIP torch nozzle with two gas injection tubes; (d) CAD model of the nozzle design, showing the micro holes’ distribution. CE–MIP: Coaxial electrode microwave induced plasma. |
Nozzle design
Microwave spectrum analysis
Fig.3 Experimental setup for microwave spectrum analysis. (a) Six degrees of freedom of the CE–MIP torch; (b) microwave propagation; (c) receiving antenna; (d) CE–MIP torch mounted on a precision motion stage; (e) signal analyser. CE–MIP: Coaxial electrode microwave induced plasma. |
Spectrum analysis results
Axis symmetry and polarization effect
Measured electric field with different MIP torch configurations
Fig.5 Measured electric field with different CE–MIP torch configurations: (a) Coaxial electrode only; (b) coaxial electrode with quartz tube; (c) coaxial electrode with quartz tube plus a chamber; (d) whole MIP torch attached with the bespoke nozzle. Note: The MIP torch contains four elements, as shown in this figure, ① coaxial electrode, ② quartz tube, ③ resonant chamber, and ④ bespoke nozzle. The adjustment of pitch and yaw are given in this figure. CE–MIP: Coaxial electrode microwave induced plasma; MIP: Microwave induced plasma. |
Analysis on the measured electric field
OES characterisation of the CE–MIP torch
OES experimental setup
Optical emission spectroscopy results
Fig.7 Photon emission intensity spatial maps with different gas injections: (a) Main gas= 1 L/min Ar; (b) main gas= 1 L/min Ar, and secondary gas= 0.01 L/min Ar; (c) main gas= 1 L/min Ar, and secondary gas= 0.01 L/min SF6; (d) main gas= 1 L/min Ar, and secondary gas= 0.01 L/min CF4. |
Optical emission spectroscopy analysis
Fig.8 Intensity of wavelength 801.5 nm. (a) Intensity of plasma jet cross section, with data acquisition at 1 mm downstream from the nozzle; (b) comparison of the intensity of the plasma jet with different secondary gases injected. The plasma jet analysis locus is 3.3 mm downstream from the nozzle at the centre of axis. |
Surface energy modification of CSP glass
Fig.9 Surface energy modification experiment and measurement. (a) Experimental setup for CE–MIP treatment of CSP glass, located on a X‒Y motion stage; (b) measurement machine for the water contact angle on the CSP glass samples. CE–MIP: Coaxial electrode microwave induced plasma; CSP: Concentrating solar power. |
Fig.10 Measurement result of the modified glass surface. (a) Water contact angle versus plasma torch travel speed, for a different number of passes; (b) water contact angle versus aging time, with plasma torch travel speed varying between 1 and 5 m/min. All samples were plasma processed with three passes. |