All brittle materials would experience a brittle-ductile mode transition when cutting with an increasing DoC from zero. According to Eq. (1) based on Griffith facture propagation criterion, the critical undeformed chip thickness
dc can be predicted by the material Young’s modulus, hardness and fracture toughness, which would be a certain value for a given material. The theoretical
dc value for DMC of tungsten carbide was calculated to be 2.114 µm [
92]. Grooving and machining tests were conducted to identify the experimental
dc value for DMC of tungsten carbide, soda-lime glass and single crystal silicon wafer. It was 2.485 µm for tungsten carbide obtained by grooving using a cubic boron nitride tool with the cutting edge radius of 5.8 µm and speed of 144 m/min [
92], 560 nm for soda-lime glass obtained by grooving using a single crystalline diamond tool at cutting diameter of 38 mm with the speed of 1000 r/min [
43], and 40 nm for single crystal silicon wafer obtained by turning using a single crystalline diamond tool with the cutting speed of 1000 r/min and feed rate of 5 µm/revolution [
45], respectively. However, the critical UCT
dc value obtained from both theoretical prediction and experimental results for DMC of brittle materials is very small, at micron, sub-micron or even nanometer level, which largely constrains their actual industry application.