Review of self-referenced measurement algorithms: Bridging lateral shearing interferometry and multi-probe error separation

Dede ZHAI, Shanyong CHEN, Ziqiang YIN, Shengyi LI

PDF(527 KB)
PDF(527 KB)
Front. Mech. Eng. ›› 2017, Vol. 12 ›› Issue (2) : 143-157. DOI: 10.1007/s11465-017-0432-3
REVIEW ARTICLE
REVIEW ARTICLE

Review of self-referenced measurement algorithms: Bridging lateral shearing interferometry and multi-probe error separation

Author information +
History +

Abstract

With the development of new materials and ultra-precision processing technology, the sizes of measured objects increase, and the requirements for machining accuracy and surface quality become more exacting. The traditional measurement method based on reference datum is inadequate for measuring a high-precision object when the quality of the reference datum is approximately within the same order as that of the object. Self-referenced measurement techniques provide an effective means when the direct reference-based method cannot satisfy the required measurement or calibration accuracy. This paper discusses the reconstruction algorithms for self-referenced measurement and connects lateral shearing interferometry and multi-probe error separation. In lateral shearing interferometry, the reconstruction algorithms are generally categorized into modal or zonal methods. The multi-probe error separation techniques for straightness measurement are broadly divided into two-point and three-point methods. The common features of the lateral shearing interferometry method and the multi-probe error separation method are identified. We conclude that the reconstruction principle in lateral shearing interferometry is similar to the two-point method in error separation on the condition that no yaw error exists. This similarity may provide a basis or inspiration for the development of both classes of methods.

Graphical abstract

Keywords

self-referenced measurement / lateral shearing interferometry / multi-probe error separation / surface metrology

Cite this article

Download citation ▾
Dede ZHAI, Shanyong CHEN, Ziqiang YIN, Shengyi LI. Review of self-referenced measurement algorithms: Bridging lateral shearing interferometry and multi-probe error separation. Front. Mech. Eng., 2017, 12(2): 143‒157 https://doi.org/10.1007/s11465-017-0432-3

References

[1]
Malacara D. Optical Shop Testing. 3rd ed. New York: John Wiley & Sons, Inc., 2007, 83, 501–503, 651–654
[2]
International Vocabulary of Metrology—Basic and General Concepts and Associated Terms. (VIM 3rd edition), JCGM 200:2012
[3]
Evans C J, Hocken R J, Estler W T. Self-calibration: Reversal, redundancy, error separation, and ‘absolute testing’. CIRP Annals —Manufacturing Technology, 1996, 45(2): 617–634
CrossRef Google scholar
[4]
PHYSICS. The SID4 HR sensor.
[5]
Korwan D. Lateral shearing interferogram analysis. Proceedings of the Society for Photo-Instrumentation Engineers, 1983, 429: 194–198
CrossRef Google scholar
[6]
Cubalchini R. Modal wave-front estimation from phase derivative measurements. Journal of the Optical Society of America, 1979, 69(7): 972–977
CrossRef Google scholar
[7]
Rimmer M P, Wyant J C. Evaluation of large aberrations using a lateral-shear interferometer having variable shear. Applied Optics, 1975, 14(1): 142–150
CrossRef Google scholar
[8]
Dai F, Tang F, Wang X, Modal wavefront reconstruction based on Zernike polynomials for lateral shearing interferometry: Comparisons of existing algorithms. Applied Optics, 2012, 51(21): 5028–5037
CrossRef Google scholar
[9]
Herrmann J. Cross coupling and aliasing in modal wavefront estimation. Journal of the Optical Society of America, 1981, 71(8): 989–992
CrossRef Google scholar
[10]
Harbers G, Kunst P J, Leibbrandt G W R. Analysis of lateral shearing interferograms by use of Zernike polynomials. Applied Optics, 1996, 35(31): 6162–6172
CrossRef Google scholar
[11]
Dai F, Tang F, Wang X, Use of numerical orthogonal transformation for the Zernike analysis of lateral shearing interferograms. Optics Express, 2012, 20(2): 1530–1544
CrossRef Google scholar
[12]
Liu X. A polarized lateral shearing interferometer and application for on-machine form error measurement of engineering surfaces. Dissertation for the Doctoral Degree. Hong Kong: Hong Kong University of Science and Technology, 2003
[13]
Ling T, Yang Y, Yue X, Common-path and compact wavefront diagnosis system based on cross grating lateral shearing interferometer. Applied Optics, 2014, 53(30): 7144–7152
CrossRef Google scholar
[14]
Freischlad K R, Koliopoulos C L. Modal estimation of a wave front from difference measurements using the discrete Fourier transform. Journal of the Optical Society of America A: Optics, Image Science, and Vision, 1986, 3(11): 1852–1861
CrossRef Google scholar
[15]
Elster C, Weingärtner I. Solution to the shearing problem. Applied Optics, 1999, 38(23): 5024–5031
CrossRef Google scholar
[16]
Flynn T J. Two-dimensional phase unwrapping with minimum weighted discontinuity. Journal of the Optical Society of America A: Optics, Image Science, and Vision, 1997, 14(10): 2692–2701
CrossRef Google scholar
[17]
Guo Y, Chen H, Xu J, Two-dimensional wavefront reconstruction from lateral multi-shear interferograms. Optics Express, 2012, 20(14): 15723–15733
CrossRef Google scholar
[18]
Ling T, Yang Y, Liu D, General measurement of optical system aberrations with a continuously variable lateral shear ratio by a randomly encoded hybrid grating. Applied Optics, 2015, 54(30): 8913–8920
CrossRef Google scholar
[19]
Karp J H, Chan T K, Ford J E. Integrated diffractive shearing interferometry for adaptive wavefront sensing. Applied Optics, 2008, 47(35): 6666–6674
CrossRef Google scholar
[20]
Elster C, Weingärtner I. Exact wave-front reconstruction from two lateral shearing interferograms. Journal of the Optical Society of America A: Optics, Image Science, and Vision, 1999, 16(9): 2281–2285
CrossRef Google scholar
[21]
Elster C. Exact two-dimensional wave-front reconstruction from lateral shearing interferograms with large shears. Applied Optics, 2000, 39(29): 5353–5359
CrossRef Google scholar
[22]
Guo Y, Xia J, Ding J. Recovery of wavefront from multi-shear interferograms with different tilts. Optics Express, 2014, 22(10): 11407–11416
CrossRef Google scholar
[23]
Dai G M. Modified Hartmann-Shack wavefront sensing and iterative wavefront reconstruction. Proceedings of the Society for Photo-Instrumentation Engineers, Adaptive Optics in Astronomy, 1994, 2201: 562–573
CrossRef Google scholar
[24]
Dai G M. Modal wavefront reconstruction with Zernike polynomials and Karhunen-Loève functions. Journal of the Optical Society of America A: Optics, Image Science, and Vision, 1996, 13(6): 1218–1225
CrossRef Google scholar
[25]
Leibbrandt G, Harbers G, Kunst P. Wave-front analysis with high accuracy by use of a double-grating lateral shearing interferometer. Applied Optics, 1996, 35(31): 6151–6161
CrossRef Google scholar
[26]
Shen W, Chang M, Wan D. Zernike polynomial fitting of lateral shearing interferometry. Optical Engineering, 1997, 36(3): 905–913
CrossRef Google scholar
[27]
van Brug H. Zernike polynomials as a basis for wave-front fitting in lateral shearing interferometry. Applied Optics, 1997, 36(13): 2788–2790
CrossRef Google scholar
[28]
Okuda S, Nomura T, Kamiya K, High precision analysis of lateral shearing interferogram using the integration method and polynomials. Applied Optics, 2000, 39(28): 5179–5186
CrossRef Google scholar
[29]
De Nicola S M, Ferraro P, Finizio A, Wave front aberration analysis in two beam reversal shearing interferometry by elliptical Zernike polynomials. Proceedings of the Society for Photo-Instrumentation Engineers, Laser Optics, 2004, 5481: 27–36
CrossRef Google scholar
[30]
Dai G M. Wavefront reconstruction from slope data within pupils of arbitrary shapes using iterative Fourier transform. Open Optics Journal, 2007, 1(1): 1–3
CrossRef Google scholar
[31]
Saunders J B. Measurement of wave fronts without a reference standard. Part 1. The wave-front-shearing interferometer. Journal of Research of the National Bureau of Standards—B. Mathematics and Mathematical Physics, 1961, 65B(4): 239–244
CrossRef Google scholar
[32]
Rimmer M P. Method for evaluating lateral shearing interferograms. Applied Optics, 1974, 13(3): 623–629
CrossRef Google scholar
[33]
Hudgin R H. Wave-front reconstruction for compensated imaging. Journal of the Optical Society of America, 1977, 67(3): 375–378
CrossRef Google scholar
[34]
Fried D L. Least-square fitting a wave-front distortion estimate to an array of phase-difference measurements. Journal of the Optical Society of America, 1977, 67(3): 370–375
CrossRef Google scholar
[35]
Southwell W H. Wave-front estimation from wave-front slope measurements. Journal of the Optical Society of America, 1980, 70(8): 998–1006
CrossRef Google scholar
[36]
Hunt B R. Matrix formulation of the reconstruction of phase values from phase differences. Journal of the Optical Society of America, 1979, 69(3): 393–399
CrossRef Google scholar
[37]
Herrmann J. Least-square wave-front errors of minimum norm. Journal of the Optical Society of America, 1980, 70(1): 28–35
CrossRef Google scholar
[38]
Liu X, Gao Y, Chang M. A partial differential equation algorithm for wavefront reconstruction in lateral shearing interferometry. Journal of Optics A: Pure and Applied Optics, 2009, 11(4): 045702
CrossRef Google scholar
[39]
Zou W, Zhang Z. Generalized wave-front reconstruction algorithm applied in a Shack-Hartmann test. Applied Optics, 2000, 39(2): 250–268
CrossRef Google scholar
[40]
Zou W, Rolland J P. Iterative zonal wave-front estimation algorithm for optical testing with general shaped pupils. Journal of the Optical Society of America A: Optics, Image Science, and Vision, 2005, 22(5): 938–951
CrossRef Google scholar
[41]
Yin Z. Exact wavefront recovery with tilt from lateral shear interferograms. Applied Optics, 2009, 48(14): 2760–2766
CrossRef Google scholar
[42]
Nomura T, Okuda S, Kamiya K, Improved Saunders method for the analysis of lateral shearing interferograms. Applied Optics, 2002, 41(10): 1954–1961
CrossRef Google scholar
[43]
Yatagai T, Kanou T. Aspherical surface testing with shearing interferometer using fringe scanning detection method. Proceedings of the Society for Photo-Instrumentation Engineers, Precision Surface Metrology, 1983, 23: 136–141
[44]
Dai F, Tang F, Wang X, Generalized zonal wavefront reconstruction for high spatial resolution in lateral shearing interferometry. Journal of the Optical Society of America A: Optics, Image Science, and Vision, 2012, 29(9): 2038–2047
CrossRef Google scholar
[45]
Dai F, Tang F, Wang X, High spatial resolution zonal wavefront reconstruction with improved initial value determination scheme for lateral shearing interferometry. Applied Optics, 2013, 52(17): 3946–3956
CrossRef Google scholar
[46]
Noll R J. Phase estimates from slope-type wave-front sensors. Journal of the Optical Society of America, 1978, 68(1): 139–140
CrossRef Google scholar
[47]
Zou W, Rolland J P. Quantifications of error propagation in slope-based wavefront estimations. Journal of the Optical Society of America A: Optics, Image Science, and Vision, 2006, 23(10): 2629–2638
CrossRef Google scholar
[48]
Takajo H, Takahashi T. Noniterative method for obtaining the exact solution for the normal equation in least-squares phase estimation from the phase difference. Journal of the Optical Society of America A: Optics, Image Science, and Vision, 1988, 5(11): 1818–1827
CrossRef Google scholar
[49]
Shiozawa H, Fukutomi Y. Development of an ultra-precision 3DCMM with the repeatability of nanometer order. JSPE Publications Series, 1999, 3: 360–365 (in Japanese)
[50]
Negishi M, A high-precision coordinate measurement machine for aspherical optics. JSPE Publications Series, 2000, 2000(2): 209–210 (in Japanese)
[51]
Whitehouse D J. Some theoretical aspects of error separation techniques in surface metrology. Journal of Physics E: Scientific Instruments, 1976, 9(7): 531–536
CrossRef Google scholar
[52]
Su H, Hong M, Li Z, The error analysis and online measurement of linear slide motion error in machine tools. Measurement Science and Technology, 2002, 13(6): 895–902
CrossRef Google scholar
[53]
Kiyono S, Gao W. Profile measurement of machined surface with a new differential method. Precision Engineering, 1994, 16(3): 212–218
CrossRef Google scholar
[54]
Li J, Zhang L, Hong M. Unified theory of error separation techniques-accordance of time and frequency methods. Acta Metrologica Sinica, 2002, 23(3): 164–166
[55]
Tanka H, Tozawa K, Sato H, Application of a new straightness measurement method to large machine tool. CIRP Annals—Manufacturing Technology, 1981, 30(1): 455–459
CrossRef Google scholar
[56]
Tozawa K, Sato H, O-hori M. A new method for the measurement of the straightness of machine tools and machined work. Journal of Mechanical Design, 1982, 104(3): 587–592
CrossRef Google scholar
[57]
Tanaka H, Sato H. Extensive analysis and development of straightness measurement by sequential-two-point method. Journal of Engineering for Industry, 1986, 108(3): 176–182
CrossRef Google scholar
[58]
Kiyono S, Huang P, Fukaya N. Datum introduced by software methods. In: International Conference of Advanced Mechatronics. 1989, 467–72
[59]
Kiyono S, Okuyama E. Study on measurement of surface undulation (2nd report): Feature measurement and digital filter. Journal of the Japan Society of Precision Engineering, 1988, 54(3): 513–518 (in Japanese)
[60]
Omar B A, Holloway A J, Emmony D C. Differential phase quadrature surface profiling interferometer. Applied Optics, 1990, 29(31): 4715–4719
CrossRef Google scholar
[61]
Kiyono S, Gao W. Profile measurement of machined surface with a new differential method. Precision Engineering, 1994, 16(3): 212–218
CrossRef Google scholar
[62]
Gao W, Kiyono S. High accuracy profile measurement of a machined surface by the combined method. Measurement, 1996, 19(1): 55–64
CrossRef Google scholar
[63]
Yin Z. Research on ultra-precision measuring straightness and surface micro topography analysis. Dissertation for the Doctoral Degree. Changsha: National University of Defense Technology, 2003 (in Chinese)
[64]
Tanaka H, Sato H. Extensive analysis and development of straightness measurement by sequential-two-points method. Journal of Engineering for Industry, 1986, 108(3): 176–182.
[65]
Gao W, Kiyono S. On-machine profile measurement of machined surface using the combined three-point method. JSME International Journal Series C: Mechanical Systems, Machine Elements and Manufacturing, 1997, 40(2): 253–259
CrossRef Google scholar
[66]
Gao W, Kiyono S. On-machine roundness measurement of cylindrical workpieces by the combined three-point method. Measurement, 1997, 21(4): 147–156
CrossRef Google scholar
[67]
Gao W, Yokoyama J, Kojima H, Kiyono S. Precision measurement of cylinder straightness using a scanning multi-probe system. Precision Engineering, 2002, 26(3): 279–288
CrossRef Google scholar
[68]
Yin Z, Li S. Exact straightness reconstruction for on-machine measuring precision workpiece. Precision Engineering, 2005, 29(4): 456–466
CrossRef Google scholar
[69]
Li S, Tan J, Pan P. Fine sequential-three-point method for on-line measurement of the straightness of precision lathes. Proceedings of the Society for Photo-Instrumentation Engineers, Measurement Technology and Intelligent Instruments, 1993, 2101, 309–312
CrossRef Google scholar
[70]
Su H, Hong M, Li Z, The error analysis and online measurement of linear slide motion error in machine tools. Measurement Science and Technology, 2002, 13(6): 895–902
CrossRef Google scholar
[71]
Li C, Li S, Yu J. High resolution error separation technique for in-situ straightness measurement of machine tools and workpiece. Mechatronics, 1996, 6(3): 337–347
CrossRef Google scholar
[72]
Liang J, Li S, Yang S. Problems and solving methods of on-line measuring straightness. Proceedings of the Society for Photo-Instrumentation Engineers, the International Society for Optical Engineering, 1993, 2101: 1081–1084
[73]
Fung E H K, Yang S M. An error separation technique for measuring straightness motion error of a linear slide. Measurement Science and Technology, 2000, 11(10): 1515–1521
CrossRef Google scholar
[74]
Fung E H K, Yang S M. An approach to on-machine motion error measurement of a linear slider. Measurement, 2001, 29(1): 51–62
CrossRef Google scholar
[75]
Yang S M, Fung E H K, Chiu W M. Uncertainty analysis of on-machine motion and profile measurement with sensor reading errors. Measurement Science and Technology, 2002, 13(12): 1937–1945
CrossRef Google scholar
[76]
Weingärtner I, Elster C. System of four distance sensors for high accuracy measurement of topography. Precision Engineering, 2004, 28(2): 164–170
CrossRef Google scholar
[77]
Elster C, Weingärtner I, Schulz M. Coupled distance sensor systems for high-accuracy topography measurement: Accounting for scanning stage and systematic sensor errors. Precision Engineering, 2006, 30(1): 32–38
CrossRef Google scholar
[78]
Schulz M, Gerhardt J, Geckeler R, Traceable multiple sensor system for absolute form measurement. Proceedings of the Society for Photo-Instrumentation Engineers, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II, 2005, 5878: 58780A
CrossRef Google scholar
[79]
Yang P, Takamura T, Takahashi S, Multi-probe scanning system comprising three laser interferometers and one auto-collimator for measuring flat bar mirror profile with nanometer accuracy. Precision Engineering, 2011, 35(4): 686–692
CrossRef Google scholar
[80]
Yin Z, Li S, Tian F. Exact reconstruction method for on-machine measurement of profile. Precision Engineering, 2014, 38(4): 969–978
CrossRef Google scholar
[81]
Yin Z, Li S, Chen S, China Patent, CN201410533360.8, 2014-10-11
[82]
Chen F. Digital shearography: State of the art and some applications. Journal of Electronic Imaging, 2001, 10(1): 240–251
CrossRef Google scholar
[83]
Mallick S, Robin M L. Shearing interferometry by wavefront reconstruction using a single exposure. Applied Physics Letters, 1969, 14(2): 61–62
CrossRef Google scholar
[84]
Nakadate S. Phase shifting speckle shearing polarization interferometer using a birefringent wedge. Optics and Lasers in Engineering, 1997, 26(4–5): 331–350
CrossRef Google scholar

Acknowledgments

This work was supported in part by the National Natural Science Foundation of China (Grant Nos. 51575520 and 51375488).

RIGHTS & PERMISSIONS

2017 Higher Education Press and Springer-Verlag Berlin Heidelberg
AI Summary AI Mindmap
PDF(527 KB)

Accesses

Citations

Detail

Sections
Recommended

/