Frontiers of Optoelectronics >
Surface-enhanced Raman scattering of sulfate ion based on Ag/Si nanostructure
Received date: 16 May 2011
Accepted date: 12 Jul 2011
Published date: 05 Dec 2011
Copyright
Silicon nanowires (SiNWs) with tens of micrometer in length have been synthesized and modified with Ag nanoparticles, which were confirmed by X-ray diffractometer (XRD), scanning electron microscopy and transmission electron microscopy. The Ag/Si nanostructure was employed to detect inorganic ions via surface-enhanced Raman scattering (SERS) with strong signals at low concentrations of 1×10-9 mol/L. This ultrasensitive method might be applied in other fields.
Yueyin SHAO , Yongqian WEI , Zhenghua WANG . Surface-enhanced Raman scattering of sulfate ion based on Ag/Si nanostructure[J]. Frontiers of Optoelectronics, 2011 , 4(4) : 378 -381 . DOI: 10.1007/s12200-011-0171-8
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