Frontiers of Optoelectronics >
Characterization of irradiated nails in terms of depolarizing Mueller matrix decompositions
Received date: 05 Apr 2017
Accepted date: 04 Jul 2017
Published date: 26 Sep 2017
Copyright
Mueller matrices were measured for natural (or reference) samples of human nails and samples irradiated by a 2 Gy ionizing radiation dose. The elements of the total Mueller matrix as a function of scattering angle were measured in backscattering mode at a wavelength of 632.8 nm. Several types of depolarizing Mueller matrix decompositions, namely, Ossikovsky, Williams, and Chipman, were calculated as a function of scattering angle for each nail sample. A comparative analysis of the sensitivity of the Mueller matrix decompositions in relation to the problem of emergency dose assessment in nails was performed.
Key words: Mueller matrix; depolarization; human nails; ionizing radiation dose; scattering
Sergey SAVENKOV , Alexander V. PRIEZZHEV , Yevgen OBEREMOK , Sergey SHOLOM , Ivan KOLOMIETS . Characterization of irradiated nails in terms of depolarizing Mueller matrix decompositions[J]. Frontiers of Optoelectronics, 2017 , 10(3) : 308 -316 . DOI: 10.1007/s12200-017-0727-3
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