Evolution of surface oxide film of typical aluminum alloy during medium-temperature brazing process

Abstract

The evolution of the surface oxide film along the depth direction of typical aluminum alloy under medium-temperature brazing was investigated by means of X-ray photoelectron spectroscopy (XPS). For the alloy with Mg content below 2.0wt%, whether under cold rolling condition or during medium-temperature brazing process, the enrichment of Mg element on the surface was not detected and the oxide film was pure Al₂O₃. However, the oxide film grew obviously during medium-temperature brazing process, and the thickness was about 80 nm. For the alloy with Mg content above 2.0wt%, under cold rolling condition, the original surface oxide film was pure Al₂O₃. However, the Mg element was significantly enriched on the outermost surface during medium-temperature brazing process, and MgO-based oxide film mixed with small amount of MgAl₂O₄ was formed with a thickness of about 130 nm. The alloying elements of Mn and Si were not enriched on the surface neither under cold rolling condition nor during mediumtemperature brazing process for all the selected aluminum alloy, and the surface oxide film was similar to that of pure aluminum, which was almost entire Al₂O₃.

Keywords

aluminum alloy / oxide film / phase structure / X-ray photoelectron spectroscopy / medium-temperature brazing

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