10-Bit single-slope ADC with error calibration for TDI CMOS image sensor

Abstract

A 10-bit single-slope analog-to-digital converter (ADC) for time-delay-integration CMOS image sensor was proposed. A programmable ramp generator was applied to accomplish the error calibration and improve the linearity. The ADC was fabricated in a 180 nm 1P4M CMOS process. Experimental results indicate that the differential nonlinearity and integral nonlinearity were 0.51/−0.53 LSB and 0.63/−0.71 LSB, respectively. The sampling rate of the ADC was 32 kHz.

Keywords

single-slope ADC / error calibration / CMOS image sensor

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