In recent decades, a lot of research has been put forward for measuring particle size and concentration of light-scattering methods and apparatuses, especially in small particle measurement. There are now a variety of fine particulate concentration measurement technologies and analysis methods
1, such as the measurement of suspended small particles in the medical field, the measurement of air pollution in environmental engineering, and the measurement of silicon surfaces in the semiconductor industry. Current methods for particle sizing include: sieving, sedimentation, laser diffraction
2, electric halo-counting, resistance method, and static images. Sieving is very simple, but low resolution requires higher skills, and long-term maintenance of measuring instruments is needed. Laser diffraction, which is based on the Fraunhofer diffraction, yields the particle formation by diffraction signals in the focal plane. This method is rapid, simple, and reproducible, but the measurement resolution is low. Halo-counting can be achieved with high-resolution measurements, but can not be used for the flow of air particles. The traditional method of imaging is by means of optical microscopy, graphics capture cards, and equipment using computer software acquisition and image processing, thus gaining particle size and shape parameters. However, the problem with the above single measurement is the limitation of the number of particles and the cumbersome process. The general resolution is to take a number of measurements through a mock field to enhance the authenticity of the test results.