Junction temperature measurement of alternating current light-emitting-diode by threshold voltage method

Ran YAO, Dawei ZHANG, Bing ZOU, Jian XU

PDF(192 KB)
PDF(192 KB)
Front. Optoelectron. ›› 2016, Vol. 9 ›› Issue (4) : 555-559. DOI: 10.1007/s12200-015-0533-8
RESEARCH ARTICLE
RESEARCH ARTICLE

Junction temperature measurement of alternating current light-emitting-diode by threshold voltage method

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Abstract

Junction temperature of alternating current light-emitting-diode (AC-LED) has a significant effect on its stable light output and lifetime. The threshold voltage measurement is employed to characterize the junction temperature of AC-LED, due to its excellent merits in high efficiency and accuracy. The threshold voltage is measured when the driving current of an AC-LED rises to a reference on-set value from the zero-crossing node. Based on multiple measurements of threshold voltage at different temperatures, a linear relationship was uncovered between the threshold voltage and the junction temperature of AC-LED with the correlating factor of temperature sensitive parameter (TSP). Thereby, we can calculate the junction temperature with the TSP and threshold voltage once the AC-LED stays at thermal equilibrium state. The accuracy of the proposed junction temperature measurement technique was found to be ±3.2°C for the reference current of 1 mA. It is concluded that the method of threshold voltage is accurate and simple to implement, making it highly suitable for measuring the junction temperature of AC-LED in industry.

Keywords

optoelectronics / junction temperature measurement / threshold voltage method / alternating current light-emitting-diode (AC-LED)

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Ran YAO, Dawei ZHANG, Bing ZOU, Jian XU. Junction temperature measurement of alternating current light-emitting-diode by threshold voltage method. Front. Optoelectron., 2016, 9(4): 555‒559 https://doi.org/10.1007/s12200-015-0533-8

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Acknowledgements

The authors gratefully acknowledge the support of the Shanghai Science and Technology Commission funded project (No. 11530502200), the National Natural Science Foundation of China (Grant No. 61078007).

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2015 Higher Education Press and Springer-Verlag Berlin Heidelberg
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