High-performance and current crowding-free InGaN-GaN-based LEDs integrated by an electrically-reverse-connected Schottky diode and a Mg-delta doped p-GaN

Sei-Min KIM, Seon-Ho JANG, Ja-Soon JANG

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PDF(254 KB)
Front. Optoelectron. ›› 2012, Vol. 5 ›› Issue (2) : 127-132. DOI: 10.1007/s12200-012-0256-z
RESEARCH ARTICLE
RESEARCH ARTICLE

High-performance and current crowding-free InGaN-GaN-based LEDs integrated by an electrically-reverse-connected Schottky diode and a Mg-delta doped p-GaN

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Abstract

This work demonstrates high-performance and current crowding-free InGaN/GaN light-emitting diodes (LEDs) using an electrically-reverse-connected Schottky diode (SD) and an Mg-delta (δ) doped layer. Possible mechanism of carrier transport at the interface between transparent conducting electrode (TCE) and p-GaN with the δ-doped layer is also investigated. Results show that the LED with the SD and Mg delta (δ)-doping layer yields lower series resistance, higher output power, and lower reverse leakage current compared to normal LEDs. In addition, unlike the normal LED, there is no occurrence for the current crowding effect in the proposed LED even at high current density of 380 mA/cm2. These remarkable behaviours clearly indicate that the use of the SD and δ-doping in the p-GaN region is very promising to achieve high-brightness and excellent-reliability GaN-based LEDs.

Keywords

GaN / light-emitting diode (LED) / Schottky diode (SD) / integration / current crowding

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Sei-Min KIM, Seon-Ho JANG, Ja-Soon JANG. High-performance and current crowding-free InGaN-GaN-based LEDs integrated by an electrically-reverse-connected Schottky diode and a Mg-delta doped p-GaN. Front Optoelec, 2012, 5(2): 127‒132 https://doi.org/10.1007/s12200-012-0256-z

References

[1]
Nakamura S, Senoh S, Iwasa N, Nagahama S. High-brightness InGaN blue, green and yellow light-emitting diodes with quantum well structures. Japanese Journal of Applied Physics, 1995, 34(Part 2, No. 7A): L797-L799
CrossRef Google scholar
[2]
Pearton S J, Zolper J C, Shul R J, Ren F. GaN: processing, defects, and devices. Journal of Applied Physics, 1999, 86(1): 1-78
CrossRef Google scholar
[3]
Guo X, Schubert E F. Current crowding and optical saturation effects in GaInN/GaN light-emitting diodes grown on insulating substrates. Applied Physics Letters, 2001, 78(21): 3337
CrossRef Google scholar
[4]
Wu J Q. When group-III nitrides go infrared: new properties and perspectives. Journal of Applied Physics, 2009, 106(1): 011101
CrossRef Google scholar
[5]
Sheu J K, Chi G C, Jou M J. Low-operation voltage of InGaN/GaN light-emitting diodes by using a Mg-doped Al0.15/Ga0.85/N/GaN superlattice. IEEE Electron Device Letters, 2001, 22(4): 160-162
CrossRef Google scholar
[6]
Jang J S, Kim D, Seong T Y. Low turn-on voltage and series resistance of polarization-induced InGaN-GaN LEDs by using p-InGaN/p-GaN superlattice. IEEE Photonics Technology Letters, 2006, 18(4): 1536-1538
CrossRef Google scholar
[7]
Jang J S, Sohn S J, Kim D, Seong T Y. Formation of low-resistance transparent Ni/Au ohmic contacts to a polarization field-induced p-InGaN/GaN superlattice. Semiconductor Science and Technology, 2006, 21(5): L37-L39
CrossRef Google scholar
[8]
Liu Y J, Tsai T Y, Yen C H, Chen L Y, Tsai T H, Liu W C. Characteristics of a GaN-based light-emitting diode with an inserted p-GaN/i-InGaN superlattice structure. IEEE Journal of Quantum Electronics, 2010, 46(4): 492-498
CrossRef Google scholar
[9]
Liu Y J, Guo D F, Chu K Y, Cheng S Y, Liou J K, Chen L Y, Tsai T H, Huang C C, Chen T Y, Hsu C S, Tsai T Y, Liu W C. Improved current-spreading performance of an InGaN-based light-emitting diode with a clear p-GaN/n-GaN barrier junction. Displays, 2011, 32(5): 330-333
CrossRef Google scholar
[10]
Jang J S. High output power GaN-based light-emitting diodes using an electrically reverse-connected p-Schottky diode and p-InGaN–GaN superlattice. Applied Physics Letters, 2008, 93(8): 081118
CrossRef Google scholar
[11]
Hsu C Y, Lan W H, Wu W S. Effect of thermal annealing of Ni/Au ohmic contact on the leakage current of GaN based light emitting diodes. Applied Physics Letters, 2003, 83(12): 2447
CrossRef Google scholar
[12]
Li D S, Chen H, Yu H B, Jia H Q, Huang Q, Zhou J M. Dependence of leakage current on dislocations in GaN-based light-emitting diodes. Journal of Applied Physics, 2004, 96(2): 1111
CrossRef Google scholar
[13]
Lin Y J. Application of the thermionic field emission model in the study of a Schottky barrier of Ni on p-GaN from current-voltage measurements. Applied Physics Letters, 2005, 86(12): 122109
CrossRef Google scholar
[14]
Pan Y B, Yang Z J, Lu Y, Lu M, Hu C Y, Yu T J, Hu X D, Zhang C Y. Improvement of properties of p-GaN by Mg delta doping. Chinese Physics Letters, 2004, 21(10): 2016
CrossRef Google scholar
[15]
Wang H, Liu J, Niu N, Shen G, Zhang S. Enhanced performance of p-GaN by Mg doping. Journal of Crystal Growth, 2007, 304(1): 7-10
CrossRef Google scholar
[16]
Bayram C, Pau J L, McClintock R, Razeghi M. Delta-doping optimization for high quality p-type GaN. Journal of Applied Physics, 2008, 104(8): 083512
CrossRef Google scholar
[17]
Park H Y, Jeon K N, Kim K. Mg delta-doping effect on a deep hole center related to electrical activation of a p-type GaN thin film. Transactions on Electrical and Electronic Materials, 2010, 11(1): 37-41
CrossRef Google scholar
[18]
Marlow G S, Das M B. The effects of contact size and non-zero metal resistance on the determination of specific contact resistance. Solid-State Electronics, 1982, 25(2): 91-94
CrossRef Google scholar
[19]
Jang J S, Seong T Y, Jeon S R. Formation mechanisms of low-resistance and thermally stable Pd∕Ni∕Pd∕Ru Ohmic contacts to Mg-doped Al 0.15Ga0.85N. Applied Physics Letters, 2007, 91(9): 092129
CrossRef Google scholar
[20]
Jang J S, Seong T Y. Electronic transport mechanisms of nonalloyed Pt Ohmic contacts to p-GaN. Applied Physics Letters, 2000, 76(19): 2743
CrossRef Google scholar
[21]
Jang S H,Jang J S. (unpublished)
[22]
Jang J S, Chang I S, Kim H K, Seong T Y, Lee S H, Park S J. Low-resistance Pt/Ni/Au ohmic contacts to p-type GaN. Applied Physics Letters, 1999, 74(1): 70
CrossRef Google scholar

Acknowledgements

This work was supported in part by the Ministry of Knowledge & Economy (MKE) through the industrial infrastructure program for fundamental technologies (No. 10033630) and through the part and material development program (No. 211C000553).

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2014 Higher Education Press and Springer-Verlag Berlin Heidelberg
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