SiC/Mg multilayer reflective mirror for He-II radiation at 30.4 nm and its thermal stability

Jingtao ZHU, Da XU, Shumin ZHANG, Wenjuan WU, Zhong ZHANG, Fengli WANG, Bei WANG, Cunxia LI, Yao XU, Zhanshan WANG, Lingyan CHEN, Hongjun ZHOU, Tonglin HUO

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Front. Optoelectron. ›› 2008, Vol. 1 ›› Issue (3-4) : 305-308. DOI: 10.1007/s12200-008-0028-y
Research article
Research article

SiC/Mg multilayer reflective mirror for He-II radiation at 30.4 nm and its thermal stability

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Abstract

In applications of solar physics, extreme ultraviolet imaging of solar corona by selecting the He-II (λ = 30.4 nm) emission line requires high reflectivity multilayer mirrors. Some material combinations were studied to design the mirrors working at a wavelength of 30.4 nm, including SiC/Mg, B4C/Mg, C/Mg, C/Al, Mo/Si, B4C/Si, SiC/Si, C/Si, and Sc/Si. Based on optimization of the largest reflectivity and the narrowest width for the multilayer mirror, a SiC/Mg material combination was selected as the mirror and fabricated by a magnetron sputtering system. The layer thicknesses of the SiC/Mg multilayer were measured by an X-ray diffractometer. Reflectivities were then measured on beamline U27 at the National Synchrotron Radiation Laboratory (NSRL) in Hefei, China. At a wavelength of 30.4 nm, the measured reflectivity is as high as 38.0%. Furthermore, a series of annealing experiments were performed to investigate the thermal stability of the SiC/Mg multilayer.

Keywords

thin film optics / solar He-II radiation / extreme ultraviolet / multilayer reflective mirror / magnetron sputtering / synchrotron radiation

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Jingtao ZHU, Da XU, Shumin ZHANG, Wenjuan WU, Zhong ZHANG, Fengli WANG, Bei WANG, Cunxia LI, Yao XU, Zhanshan WANG, Lingyan CHEN, Hongjun ZHOU, Tonglin HUO. SiC/Mg multilayer reflective mirror for He-II radiation at 30.4 nm and its thermal stability. Front Optoelec Chin, 2008, 1(3-4): 305‒308 https://doi.org/10.1007/s12200-008-0028-y

References

[1]
RavetM F, BridouF, Zhang-SongX, . Ion beam deposited Mo/Si multilayers for EUV imaging applications in astrophysics. Proceedings of SPIE, 2004, 5250: 99–108
CrossRef Google scholar
[2]
GardnerL, KohlJ, CranmerS, . The advanced solar coronal explorer mission (ASCE).Proceedings of SPIE, 1999, 3764: 134–146
CrossRef Google scholar
[3]
GrigonisM, KnystautasE J. C/Si multilayer mirrors for the 25–30 nm wavelength region. Applied Optics, 1997, 36(13): 2839–2842
CrossRef Google scholar
[4]
ZhangZ, WangZ S, QinS J, . The design of X-ray supermirror with broad angle range. Acta Photonica Sinica, 2003, 32(2): 253–256 (in Chinese)
[5]
VialJ C, SongX Y, LemaireP, . The solar high-resolution imager-coronagraph LYOT mission. Proceedings of SPIE, 2003, 4853: 479–489
CrossRef Google scholar
[6]
WindtD L, DonguyS, SeelyJ F, . EUV multilayers for solar physics. Proceedings ofSPIE, 2004, 5168: 1–11
CrossRef Google scholar
[7]
WangF L, WangZ S, QinS J, . Investigation of ultra-short-period W/C multilayers for soft X-ray optics. Chinese Optics Letters, 2005, 3(7): 425–427
[8]
ZhangZ, WangZ S, WangF L, . Design and fabrication of broad angular range depth-graded C/W multilayer mirror for hard X-ray optics. Chinese Optics Letters, 2005, 3(7): 422–424
[9]
ChenB, NiQ L, CaoJ H, . Development of a space soft X-ray and EUV normal incidence telescope. Optics and Precision Engineering, 2003, 11(4): 315–319 (in Chinese)
[10]
WangZ S, ZhangS M, WuW J, . B4C/Mo/Si high reflectivity multilayer mirror at 30.4 nm. Chinese Optics Letters, 2006, 4(10): 611–613
[11]
WangZ S, WangH C, ZhuJ T, . Broad angular multilayer analyzer for soft X-rays, Optics Express, 2006, 14(6): 2533–2538
[12]
WangZ S, WangH C, ZhuJ T, . Broadband multilayer polarizers for the extreme ultraviolet. Journal of Applied Physics, 2006, 99(5): 056108
[13]
WangZ S, WangH C, ZhuJ T, . Extreme ultraviolet broadband Mo/Y multilayer analyzers. Applied Physics Letters, 2006, 89(24): 241120
[14]
WangZ S, WangH C, ZhuJ T, . Broadband Mo/Si multilayer transmission phase retarders for the extreme ultraviolet. Applied Physics Letters, 2007, 90(3): 031901
[15]
WangH C, ZhuJ T, WangZ S, . Broadband Mo/Si multilayer analyzers for the 15–17 nm wavelength range. Thin Solid Films, 2006, 515(4): 2523–2526
[16]
SpillerE. Reflective multilayer coatings for the far UV region. Applied Optics, 1976, 15(10): 2333–2338
CrossRef Google scholar
[17]
WangZ S, MaY Y. Researches on extreme ultraviolet multilayers fabrication. Optical Technique, 2001, 27(6): 532–534 (in Chinese)
[18]
WangH C, WangZ S, QinS J, . Analysis of the reflectivity of Mo/Si multilayer film for soft X-ray. Acta Optica Sinica, 2003, 23(11): 1362–1365 (in Chinese)
[19]
WangZ S. Effect of film thickness errors on performance of soft X-ray multilayer. Optics and Precision Engineering, 2003, 11(2): 136–138 (in Chinese)
[20]
ZhuJ T, WangZ S, ZhangS M, . High reflectivity multilayer mirror for He-II radiation at 30.4 nm in solar physics application, In: Optical Interference Coatings 2007, Tucson: Optical Society of America, 2007, FA9

Acknowledgements

This work was supported by the National Nature Science Foundation of China (Grant Nos. 10435050, 10675092), and Hi-Tech Research and Development Program of China (No. 2006AA12Z139).

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2014 Higher Education Press and Springer-Verlag Berlin Heidelberg
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