Mechanism and threshold modeling of femtosecond laser-induced damage in metal nanofilms for photoacoustic characterization

Abstract

Femtosecond photoacoustic characterization offers a high-resolution, non-destructive approach for probing metal nanofilms; however, high-repetition-rate laser excitation can induce thermal or mechanical damage, compromising measurement reliability. While existing studies primarily focus on high-energy laser processing, predictive modeling of damage thresholds under low-fluence, multi-pulse excitation remains limited. This study establishes a multiphysics-based framework for predicting laser-induced damage thresholds, encompassing single-pulse failure mechanisms, including thermal melting and stress-induced yielding, as well as thermal accumulation effects under repetitive pulses. A curve-fitting strategy is proposed to efficiently estimate steady-state lattice temperatures during continuous excitation. Using Cu nanofilms as a case study, the influence of film thickness on damage thresholds is systematically analyzed. The predicted thresholds are compared with experimental data to validate the model’s applicability and accuracy. This work provides theoretical guidance for assessing damage risks and optimizing photoacoustic measurements across varying operating conditions.

Graphical abstract

Keywords

femtosecond photoacoustic / laser-induced damage threshold / metal nanofilms / multiphysics modeling / thermal accumulation effect

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