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Theory of the resonance escape factors of plasma
resonance lines basing on the exact Voigt profile
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School of Science, Henan University of Science and Technology;
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| Published |
| 05 Sep 2008 |
| Issue Date |
| 05 Sep 2008 |
In this paper, based on the exact Voigt profile we obtained, we derive the theory of resonance escape factors of plasma resonance lines, for both Lorentzian profile and Voigt profile. The oscillator strength, the number density of the absorbing atoms in the ground state, and the optical depth in the line center are discussed. As an example, the helium He I 1083.0 nm, lithium Li I 670.970 nm and carbon C I 111.74 nm are discussed for infrared, visible and ultraviolet regions. The results we calculated are in good agreement with the experimental results. These calculations will be significant in the theoretical analysis of plasma.
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