Shot noise in nano-electronic systems under the perturbation
of ac fields
ZHAO Hong-kang
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Department of Physics, Beijing Institute of Technology, Beijing 100081, China;
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Published
05 Mar 2007
Issue Date
05 Mar 2007
Abstract
Current noise exists in circuits and electronic devices generally, and it exhibits specific features as the system reaches nanometer size. The noise in the nano-system where external ac fields are applied plays an important role, since the properties of the fields and the nano-system together govern the resulting noise. In this paper, we present the derivation of shot noise by employing the non-equilibrium Green s function technique. The more general formulas for the current correlation and noise spectral density are given. The system is composed of a central nano-system coupled to electrodes, and the obtained noise formulas are related to the Green s functions of detailed central regime and the terminals. As an example, we have performed the numerical calculation on a system with a toroidal carbon nanotube coupled to normal metal leads. The noise and Fano factor show intimate relation with the structure of the system and ac fields. The Aharonov-Bohm-like behaviors on the shot noise spectral density and Fano factor are observed to exhibit oscillation structures with period of quantum flux.
ZHAO Hong-kang.
Shot noise in nano-electronic systems under the perturbation
of ac fields. Front. Phys., 2007, 2(1): 55‒62 https://doi.org/10.1007/s11467-007-0009-4
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