Shot noise in nano-electronic systems under the perturbation of ac fields

ZHAO Hong-kang

PDF(592 KB)
PDF(592 KB)
Front. Phys. ›› 2007, Vol. 2 ›› Issue (1) : 55-62. DOI: 10.1007/s11467-007-0009-4

Shot noise in nano-electronic systems under the perturbation of ac fields

  • ZHAO Hong-kang
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Abstract

Current noise exists in circuits and electronic devices generally, and it exhibits specific features as the system reaches nanometer size. The noise in the nano-system where external ac fields are applied plays an important role, since the properties of the fields and the nano-system together govern the resulting noise. In this paper, we present the derivation of shot noise by employing the non-equilibrium Green s function technique. The more general formulas for the current correlation and noise spectral density are given. The system is composed of a central nano-system coupled to electrodes, and the obtained noise formulas are related to the Green s functions of detailed central regime and the terminals. As an example, we have performed the numerical calculation on a system with a toroidal carbon nanotube coupled to normal metal leads. The noise and Fano factor show intimate relation with the structure of the system and ac fields. The Aharonov-Bohm-like behaviors on the shot noise spectral density and Fano factor are observed to exhibit oscillation structures with period of quantum flux.

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ZHAO Hong-kang. Shot noise in nano-electronic systems under the perturbation of ac fields. Front. Phys., 2007, 2(1): 55‒62 https://doi.org/10.1007/s11467-007-0009-4
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