Quantitative modeling of perovskite-based direct X-ray flat panel detectors

Zihao Song , Gaozhu Wang , Jincong Pang , Zhiping Zheng , Ling Xu , Ying Zhou , Guangda Niu , Jiang Tang

Front. Optoelectron. ›› 2024, Vol. 17 ›› Issue (4) : 32

PDF (1542KB)
Front. Optoelectron. ›› 2024, Vol. 17 ›› Issue (4) : 32 DOI: 10.1007/s12200-024-00136-0
LETTER

Quantitative modeling of perovskite-based direct X-ray flat panel detectors

Author information +
History +
PDF (1542KB)

Abstract

Direct X-ray detectors based on semiconductors have drawn great attention from researchers in the pursuing of higher imaging quality. However, many previous works focused on the optimization of detection performances but seldomly watch them in an overall view and analyze how they will influence the detective quantum efficiency (DQE) value. Here, we propose a numerical model which shows the quantitative relationship between DQE and the properties of X-ray detectors and electric circuits. Our results point out that pursuing high sensitivity only is meaningless. To reduce the medical X-ray dose by 80%, the requirement for X-ray sensitivity is only at a magnitude of 103 µCGy-1·cm-2. To achieve the DQE = 0.7 at X-ray sensitivity air from 1248 to 8171 µCGy-1air·cm-2, the requirements on dark current density ranges from 10 to 100 nA·cm-2 and the fluctuation of current density should fall in 0.21 to 1.37 nA·cm-2.

Graphical abstract

Keywords

DQE / X-ray / Detector / Perovskite

Cite this article

Download citation ▾
Zihao Song, Gaozhu Wang, Jincong Pang, Zhiping Zheng, Ling Xu, Ying Zhou, Guangda Niu, Jiang Tang. Quantitative modeling of perovskite-based direct X-ray flat panel detectors. Front. Optoelectron., 2024, 17(4): 32 DOI:10.1007/s12200-024-00136-0

登录浏览全文

4963

注册一个新账户 忘记密码

References

RIGHTS & PERMISSIONS

The Author(s) 2024

AI Summary AI Mindmap
PDF (1542KB)

511

Accesses

0

Citation

Detail

Sections
Recommended

AI思维导图

/