Reflected-intensity distribution of angle-tuned thin film filter based on frequency recursive algorithm

Kan YU, Juanjuan YIN, Jiaqi BAO

PDF(265 KB)
PDF(265 KB)
Front. Optoelectron. ›› 2013, Vol. 6 ›› Issue (2) : 175-179. DOI: 10.1007/s12200-013-0311-4
RESEARCH ARTICLE
RESEARCH ARTICLE

Reflected-intensity distribution of angle-tuned thin film filter based on frequency recursive algorithm

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Abstract

For a three-port angle-tuned thin film filter, the characteristic of reflected-port is very important to reflect multiple wavelengths spectrum. As the filter is in tilted incidence, the reflected-facula broadens and the reflectivity decreases. In this paper, we proposed a frequency recursive algorithm based on fast Fourier transform and Fresnel formula. The reflected-intensity distribution of the narrowband filter from normal incidence to 40° tilted incidence was simulated by this frequency recursive algorithm. Meanwhile, the beam field experiments were accordingly performed in this study. Compared with the traditional beam spatial superposition method, the frequency recursive algorithm is more efficient and precise in calculating the reflectivity of the reflected beam, suggesting the frequency recursive algorithm may be more helpful for fabricating the three-port tunable thin film filter.

Keywords

thin film filter / recursive algorithm / tilted incidence / fast Fourier transform

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Kan YU, Juanjuan YIN, Jiaqi BAO. Reflected-intensity distribution of angle-tuned thin film filter based on frequency recursive algorithm. Front Optoelec, 2013, 6(2): 175‒179 https://doi.org/10.1007/s12200-013-0311-4

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Acknowledgements

This work was supported by the National Natural Science Foundation of China (Grant No. 61205062) and the Nature Science Foundation of Hubei Province of China (No. 2012FFB02701).

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2014 Higher Education Press and Springer-Verlag Berlin Heidelberg
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