Spectral emittance measurements of micro/nanostructures in energy conversion: a review

doi:10.1007/s11708-020-0693-0

Front. Energy

2020, Vol. 14

Issue (3) : 482-509 https://doi.org/10.1007/s11708-020-0693-0

REVIEW ARTICLE

Spectral emittance measurements of micro/nanostructures in energy conversion: a review

Shiquan SHAN¹, Chuyang CHEN², Peter G. LOUTZENHISER², Devesh RANJAN², Zhijun ZHOU³(

), Zhuomin M. ZHANG²(

)

¹. State Key Laboratory of Clean Energy Utilization, Zhejiang University, Hangzhou 310027, China; George W. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta GA 30332, USA
². George W. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta GA 30332, USA
³. State Key Laboratory of Clean Energy Utilization, Zhejiang University, Hangzhou 310027, China

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Abstract

Micro/nanostructures play a key role in tuning the radiative properties of materials and have been applied to high-temperature energy conversion systems for improved performance. Among the various radiative properties, spectral emittance is of integral importance for the design and analysis of materials that function as radiative absorbers or emitters. This paper presents an overview of the spectral emittance measurement techniques using both the direct and indirect methods. Besides, several micro/nanostructures are also introduced, and a special emphasis is placed on the emissometers developed for characterizing engineered micro/nanostructures in high-temperature applications (e.g., solar energy conversion and thermophotovoltaic devices). In addition, both experimental facilities and measured results for different materials are summarized. Furthermore, future prospects in developing instrumentation and micro/nanostructured surfaces for practical applications are also outlined. This paper provides a comprehensive source of information for the application of micro/nanostructures in high-temperature energy conversion engineering.

Keywords concentrating solar power (CSP) emittance measurements high temperature micro/nanostructure selective absorber selective emitter thermophotovoltaics (TPV)

Corresponding Author(s): Zhijun ZHOU,Zhuomin M. ZHANG

Online First Date: 28 August 2020 Issue Date: 14 September 2020

Cite this article:

Shiquan SHAN,Chuyang CHEN,Peter G. LOUTZENHISER, et al. Spectral emittance measurements of micro/nanostructures in energy conversion: a review[J]. Front. Energy, 2020, 14(3): 482-509.

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http://journal.hep.com.cn/fie/EN/10.1007/s11708-020-0693-0
http://journal.hep.com.cn/fie/EN/Y2020/V14/I3/482

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Fig.1 Schematic diagram.

Fig.2 Schematic diagram of a high-temperature spectral emisso-meter (reprinted from Ref. [²⁷] with permission).

Fig.3 Experimental setup of PTB for measuring the spectral directional emittance.

Fig.4 Schematic of the infrared spectral emittance characterization facility at NIST (reprinted from Ref. [²⁴] with permission).

Fig.5 Optical layout of the high-temperature spectral emisso-meter at the Georgia Institute of Technology (reprinted from Ref. [²⁵] with permission).

Fig.6 The vacuum emissiometry setup at the National Institute of Optics in Italy (reprinted from Ref. [²⁶] with permission).

Detecting instrument	Wavelength/μm	Temperature/K	Directionality	Heating method	Organization	References
FTIR	4–40	353 to 673	Directional (5° to 70°) and hemispherical	Electrical heater	PTB (No. 1, Germany)	[²²,⁴⁷]
FTIR	1–1000	273 to 703	Directional (0° to 70°) and hemispherical	Bifilarly wound wire heater	PTB (No. 2, Germany)	[²³,⁴⁸]
FTIR	1–20	600 to 1400	Directional (0° to 75°)	Cs and Na heat-pipe heater	NIST (USA)	[²⁴,⁴⁹]
FTIR	2–19	Up to 1000	Directional (0° to 60°)	Electrical coil heater	Georgia Institute of Technology (USA)	[²⁵,⁵⁰]
FTIR	2.5–20	500 to 1200	Normal, 45° and 70°, and hemispherical	Electric heating	CNR-INO National Institute of Optics (Italy)	[²⁶]
FTIR	1.3–25	Ambient to 1050	Directional (0° to 80°)	Electrical coil heater	Universidad of the Basque Country (Spain)	[²⁷]
Monochromator (thermal detector)	0.8–2.2	473 to 1273	Normal	Cast iron plate heater	Henan Normal University (China)	[³⁹]
FTIR	1.3–29	Up to 1400	Directional (0° to 60°)	Ceramic heater	Harbin Institute of Technology (China)	[⁴³]
FTIR	2–25	1073 to 1873	Normal	Flame torch/ tubular furnace	Nanjing University of Science and Technology (China)	[⁴⁴]
Monochromator (photon detector)	2–15	473 to 1003	Directional (N/A)	Electrical coil heater	National Institute of Metrology (China)	[⁵¹]
Spectroradiometer	0.6–40	1300 to 2500	Directional (0° to 80°)	Solar furnace	PROMES-CNRS (France)	[⁵²]
FTIR	8–14	173 to 213	Normal	Refrigerator (cooling)	Chinese Academy of Sciences (China)	[⁵³]
FTIR	1.4–26	550 to 1250	Normal	Laser heating	University of West Bohemia (Czech Republic)	[⁵⁴,⁵⁵]
FTIR	5–25	325 to 405	Normal	Solar-like halogen lamp	Brown University (USA)	[⁵⁶]
FTIR	2–9	Up to 973	Normal	Electrical heater	University of Wisconsin-Madison (USA)	[⁵⁷]
FTIR	0.7–29	773 to 1273	Normal	Blackbody radiator	Ruhr-University Bochum (Germany)	[⁵⁸,⁵⁹]
FTIR	0.8–8	1000 to 1700	Normal	Oxygen-gas flame	Tohoku University (Japan)	[⁶³,⁶⁴]
FTIR	1.5–20	Up to 2226	Normal	Oxy/acetylene torch	Advanced Fuel Research Inc. (USA)	[⁶⁷]
FTIR	5–12	253 to 373	Normal	Circulating fluid	National Research Laboratory of Metrology (Japan)	[⁶⁸]
FTIR	1.6–22	373 to 1673	Normal	Tantalum wire heater	Tokai University (Japan)	[⁶⁹]
FTIR	2.5–25	323 to 773	Directional (0° to 50°)	Electrical heater	Korea Research Institute of Standards and Science (South Korea)	[⁷⁰]
FTIR	0.6–15	773 to 1623	Normal	Electrical heater	Bundeswehr University of Munich (Germany)	[⁷¹]
FTIR	1–25	373 to 1473	Normal	Electrical heater	University of Duisburg-Essen (Germany)	[⁷²]

Tab.1 Summary of direct emittance measurement instruments

Fig.7 Schematic with details of the indirect measurement method at NIST (reprinted from Ref. [²⁸] with permission).

Fig.8 Solar facility for optical properties characterization at PROMES laboratory (reprinted from Ref. [⁷⁶] with permission).

Fig.9 Experimental setup for characterizing spectral normal optical properties with FTIR fiber optics technique at elevated temperatures (reprinted from Ref. [⁷⁷] with permisssion).

Fig.10 Illustration of different micro/nanostructures.

Fig.11 Representative spectra for the spectral solar irradiance (AM1.5), blackbody emissive power at 1000 K, and the “ideal” absorptance/emittance spectrum for a solar absorber.

Fig.12 Spectral absorptance of an all-ceramic solar selective absorber.

Tab.2 Summary of spectral selective solar absorbers

Fig.13 Metamaterial solar absorber.

Fig.14 Spectral EQE of an InAsSbP TPV cell, spectral emissive power of a blackbody at 1500 K, and the emittance spectra of ideal broadband and narrowband selective emitters.

Structure	Materials	Method and instrument	Directionality	Wavelength /μm	Temperature /K	Maximum normal emittance (wavelength location)	References
Periodic grating	Micro-grooved Si	Direct (spectrometer)	Directional (0° to 80°)	2–14	573 and 673	About 0.9 (3 μm)	[⁶¹]
Periodic grating	Tungsten 2D grating	Direct (FTIR)	Directional (0° and 30°)	1.0–5.0	1200	0.7 (1.6 μm)	[¹⁰⁵]
Periodic grating	SiC 1D grating	Direct (FTIR)	Normal	9.5–13	773	0.9 (11.1 μm)	[¹⁰⁶]
Microcavity	Pt-coated Si reverse-pyramid cavities	Direct (FTIR)	Normal	0.8–5	890	0.8 (1.6 μm)	[⁶³]
Microcavity	Ti-coated Si rectangular cavities	Direct (spectrometer)	Normal	1–5	1073	0.8 (3.2 μm)	[⁶⁵]
Microcavity	Ni rectangular cavities	Direct (spectrometer)	Normal	0.7–4	1000	0.95 (0.87 μm)	[⁶⁶]
Microcavity	Cr-coated Si rectangular cavities	Direct (FTIR)	Directional (0° to 15°)	3–25	750	About 0.6 (6–10 μm)	[¹⁰⁷]
Microcavity	W rectangular cavities	Direct (FTIR)	Normal	0.6–4	Up to 1400	0.8 (1.25 μm)	[¹⁰⁸,¹⁰⁹]
Microcavity	Perovskite-type manganese thermochromic materials	Indirect (FTIR)	Near-normal	1.25–25.5	173 to 373	0.95 (4 μm)	[¹¹¹]
Microcavity	Ag-coated Si microcavities	Indirect (FTIR)	Near-normal	3.6–25	Room temperature	Near unity (8.87 μm, 5.63 μm, and 3.89 μm)	[¹¹²]
Microcavity	LSMO-coated silicon microcavity	Indirect (FTIR)	Near-normal	2.5–25	97 to 373	Near unity (6.5 μm)	[¹¹³]
Multilayer	Fabry-Perot cavity resonator	Direct (FTIR)	Directional (0° to 30°)	2–20	294, 600, and 800	About 0.8 (4.5 μm, 2.27 μm)	[²⁵]
Metamaterial	Au-grating/SiO₂/Au on Si substrate	Direct (FTIR)	Directional (0° to 30°)	3.33–10	700 and 750	0.8 (7.69 μm), 0.6 (4.17 μm)	[⁵⁰]
Metamaterial	SiC metasurfaces (2D-grooved)	Indirect (FTIR+ microscope)	Near-normal	8–13	Room temperature	0.8 (12 μm)	[⁷⁸]
Metamaterial	Pt-pattern/Al₂O₃/Pt on sapphire substrate	Indirect (FTIR+ microscope)	Near-normal	0.8–3.5	Room temperature	Near unity (1.5 μm)	[¹¹⁴]
1D PhC	SiO₂/Si₃N₄ 1D-PhC on Ag	Indirect (FTIR)	Directional (0°–80°)	0.85–1.1	Room temperature	0.6 (0.975 μm)	[¹¹⁷,¹¹⁸]
2D PhC	W cylindrical hole array	Indirect (FTIR)	Near-normal	1–3	Room temperature	Near unity (1.5 μm)	[⁸⁷]
2D PhC	Ta cylindrical hole array	Indirect (FTIR)	Near-normal	1.4–3	Room temperature	Near unity (1.9 μm)	[⁸⁸]
2D PhC	HfO₂-coated Ta cylindrical hole array	Indirect (FTIR)	Near-normal	0.3–3	Room temperature	Near unity (1.9 μm)	[⁹⁹]
2D PhC	Ta-W alloy cylindrical hole array	Indirect (FTIR)	Near-normal	1.4–3	Room temperature	Near unity (2 μm)	[¹¹⁵,¹¹⁶]
3D PhC	Ni woodpile structure	Direct (FTIR)	Normal	2–14	600, 700 and 800	0.65 (3 μm)	[¹²⁰]
3D PhC	Pt-coated silicon scaffold	Direct (FTIR)	Directional (0° to 75°)	1.8–10.2	889 and 939	Near unity (2.5 μm)	[122]

Tab.3 Summary of spectral selective TPV emitters

Fig.15 Measured spectral emittance of microcavities.

Fig.16 (a) Schematic of the fabricated Fabry-Perot cavity resonator; (b) and (c) the emittance spectra for TE and TM waves, respectively, at different temperatures for

θ =

30°; (d) schematic of the metamaterial emitter made of a gold grating and SiO₂ spacer on an optically opaque Au film; (e) emittance measured with a DTGS detector; (f) emittance measured with an InSb detector for TM wave at 700 K for different zenith angles (adapted with permission from Ref. [²⁵] for (a, b, c); and from Ref. [⁵⁰] for (d, e, f)).

Fig.17 SEM images.

C_f	Solar concentration factor
C₁	First radiation constant
C₂	Second radiation constant
E	Emissive power/(W?m⁻²)
E_λ	Spectral emissive power/(W?m⁻²?mm⁻¹)
G₀	Total solar irradiance/(W?m⁻²)
G_λ	Spectral solar irradiance/(W?m⁻²?mm⁻¹)
I	Radiation intensity/(W?m⁻²?sr⁻¹)
I_λ	Spectral intensity/(W?m⁻²?sr⁻¹?mm⁻¹)
T	Temperature/K
Greek symbols
α	Absorptance
ε	Emittance
η	Efficiency
θ	Zenith angle/(°)
$Λ$	Period of nanostructure/μm
λ	Wavelength/μm
ρ	Reflectance
σ	Stefen-Boltzmann constant
ψ	Azimuthal angle
Subscript
a	Absorber
b	Blackbody
θ	Directional
λ	Spectral
Abbreviation
CSP	Concentrating solar power
EQE	External quantum efficiency
FTIR	Fourier-transform infrared (spectrometer)
PhC	Photonic crystal
PV	Photovoltaic
TPV	Thermophotovoltaic(s)

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