Understanding oxidation resistance of Pt-based alloys through computations of Ellingham diagrams with experimental verifications

Xiaoyu Chong , Wei Yu , Yingxue Liang , Shun-Li Shang , Chao Li , Aimin Zhang , Yan Wei , Xingyu Gao , Yi Wang , Jing Feng , Li Chen , Haifeng Song , Zi-Kui Liu

Journal of Materials Informatics ›› 2023, Vol. 3 ›› Issue (4) : 21

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Journal of Materials Informatics ›› 2023, Vol. 3 ›› Issue (4) :21 DOI: 10.20517/jmi.2023.17
Research Article

Understanding oxidation resistance of Pt-based alloys through computations of Ellingham diagrams with experimental verifications

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Abstract

Thermodynamic calculations of Ellingham diagrams and the forming oxides have been performed relevant to the Pt-based alloys Pt82Al12M6 (M = Cr, Hf, Pt, and Ta). The predicted Ellingham diagrams indicate that the elements Hf and Al are easy to oxidize, followed by Ta and Cr, while Pt is extremely difficult to oxidize. Oxidation experiments characterized by X-ray diffraction (XRD) and electron probe micro-analyzers verify the present thermodynamic predictions, showing that the best alloy with superior oxidation resistance is Pt82Al12Cr6, followed by Pt88Al12 due to the formation of the dense and continuous α-Al2O3 scale on the surface of alloys; while the worse alloy is Pt82Al12Hf6 followed by Pt82Al12Ta6 due to drastic internal oxidation and the formation of deleterious HfO2, AlTaO4, and Ta2O5. The present work, combining computations with experimental verifications, provides a fundamental understanding and knowledgebase to develop Pt-based superalloys with superior oxidation resistance that can be used in ultra-high temperatures.

Keywords

Ellingham diagrams / Pt-based alloys / oxidation resistance / XRD / EPMA

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Xiaoyu Chong, Wei Yu, Yingxue Liang, Shun-Li Shang, Chao Li, Aimin Zhang, Yan Wei, Xingyu Gao, Yi Wang, Jing Feng, Li Chen, Haifeng Song, Zi-Kui Liu. Understanding oxidation resistance of Pt-based alloys through computations of Ellingham diagrams with experimental verifications. Journal of Materials Informatics, 2023, 3(4): 21 DOI:10.20517/jmi.2023.17

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