Natural movement: Measuring optimal pathway configuration of museum layout and pedestrian accessibility through visibility graph analysis and intelligent agent simulation
Xiang Wang , Mengsi Yang , Weicong Li , Lin Yuan , Qimeng Ren , Qian Xie , Runze Liu
Front. Archit. Res. ›› 2025, Vol. 14 ›› Issue (5) : 1228 -1248.
Natural movement: Measuring optimal pathway configuration of museum layout and pedestrian accessibility through visibility graph analysis and intelligent agent simulation
This study explores the interaction between spatial configuration, natural mobility, and visual accessibility in exhibition spaces, an area that remains underexplored. By integrating visibility graph analysis (VGA), intelligent agent simulation (IAS), topological analysis, and field observation, the research examines functional layout and accessibility across four museums. Findings indicate that corridors and pathways, second only to exhibition halls, play a crucial role in spatial mobility. Composite layouts (e.g., circular and L-shaped designs) exhibit superior mean depth and integration, yet connectivity and mean depth demonstrate a nonlinear relationship. Elongated or complex path turns increase cognitive load, complicating navigation, while open passageways promote smoother visitor distribution. Topological analysis effectively identifies optimal nodes, key locations, and path-turn efficiency under accessibility constraints. Visitor dwell time is shaped not only by exhibit content but also by spatial location, entry sequence, and visitor density. Results support the assumption that space syntax models align with real-world visitor flow patterns, yet predictive models fail to fully capture variations in mobility across different timeframes and behavioral contexts. These insights contribute to optimizing museum design for improved visitor experience and spatial efficiency.
Museum / Functional configuration / Layout structure / Spatial mobility / Space syntax / Topological analysis
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The Author(s). Publishing services by Elsevier B.V. on behalf of Higher Education Press and KeAi.
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