Figures-of-merit for integrated bypass diode design in passivating-contact back-contact silicon solar cells: A TCAD simulation study

Zhuohan Zhang , Wei Liu , Daming Chen , Yifeng Chen , Pietro P. Altermatt

ENG.Energy ›› 2026, Vol. 20 ›› Issue (6) : 11011

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ENG.Energy ›› 2026, Vol. 20 ›› Issue (6) :11011 DOI: 10.1007/s11708-026-1101-1
RESEARCH ARTICLE
Figures-of-merit for integrated bypass diode design in passivating-contact back-contact silicon solar cells: A TCAD simulation study
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Abstract

The design of an integrated bypass diode employed for hot-spot protection in passivating-contact back-contact (TBC) solar cells involves an inherent tension: the structure must conduct sufficient current under reverse bias to prevent hot-spot formation, yet remain highly resistive under forward bias to avoid degrading power output of cells. However, the complex interplay among band-to-band tunneling (BTBT), trap-assisted tunneling (TAT), interdiffusion, and oxide pinholes that governs reverse conduction and forward leakage remains poorly quantified. A quantitative design framework based on two linked figures of merit (FoM1 and FoM2) is established through comprehensive technology computer-aided design (TCAD) simulations. FoM1 quantifies electrical selectivity as the reverse-to-forward current ratio, while FoM2 translates this selectivity into a geometric design criterion for the overlap region. Systematic parameter exploration reveals phosphorus interdiffusion as the dominant degradation mechanism, suppressing BTBT by over two orders of magnitude even at moderate junction grading. Pinholes exhibit a dual character, enhancing reverse conduction only when interdiffusion is controlled. Design windows ensuring effective hot-spot protection with acceptable forward-bias power loss are established as functions of pinhole density, trap concentration, and interdiffusion depth. A diagnostic methodology distinguishing polysilicon-region degradation from substrate parasitic recombination provides experimentally testable design rules for next-generation TBC cells.

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Keywords

TBC solar cells / hot-spot prevention / Esaki diode / band-to-band tunneling / trap-assisted tunneling / figures of merit / TCAD simulation

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Zhuohan Zhang, Wei Liu, Daming Chen, Yifeng Chen, Pietro P. Altermatt. Figures-of-merit for integrated bypass diode design in passivating-contact back-contact silicon solar cells: A TCAD simulation study. ENG.Energy, 2026, 20 (6) : 11011 DOI:10.1007/s11708-026-1101-1

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