Figures-of-merit for integrated bypass diode design in passivating-contact back-contact silicon solar cells: A TCAD simulation study
Zhuohan Zhang , Wei Liu , Daming Chen , Yifeng Chen , Pietro P. Altermatt
ENG.Energy ›› 2026, Vol. 20 ›› Issue (6) : 11011
The design of an integrated bypass diode employed for hot-spot protection in passivating-contact back-contact (TBC) solar cells involves an inherent tension: the structure must conduct sufficient current under reverse bias to prevent hot-spot formation, yet remain highly resistive under forward bias to avoid degrading power output of cells. However, the complex interplay among band-to-band tunneling (BTBT), trap-assisted tunneling (TAT), interdiffusion, and oxide pinholes that governs reverse conduction and forward leakage remains poorly quantified. A quantitative design framework based on two linked figures of merit (FoM1 and FoM2) is established through comprehensive technology computer-aided design (TCAD) simulations. FoM1 quantifies electrical selectivity as the reverse-to-forward current ratio, while FoM2 translates this selectivity into a geometric design criterion for the overlap region. Systematic parameter exploration reveals phosphorus interdiffusion as the dominant degradation mechanism, suppressing BTBT by over two orders of magnitude even at moderate junction grading. Pinholes exhibit a dual character, enhancing reverse conduction only when interdiffusion is controlled. Design windows ensuring effective hot-spot protection with acceptable forward-bias power loss are established as functions of pinhole density, trap concentration, and interdiffusion depth. A diagnostic methodology distinguishing polysilicon-region degradation from substrate parasitic recombination provides experimentally testable design rules for next-generation TBC cells.
TBC solar cells / hot-spot prevention / Esaki diode / band-to-band tunneling / trap-assisted tunneling / figures of merit / TCAD simulation
| [1] |
|
| [2] |
|
| [3] |
|
| [4] |
|
| [5] |
Herrmann W, Wiesner W, Vaassen W. Hot spot investigations on PV modules-new concepts for a test standard and consequences for module design with respect to bypass diodes. In: Proceedings of the 26th IEEE Photovoltaic Specialists Conference, Anaheim, USA, 1997, 1129–1132 |
| [6] |
|
| [7] |
|
| [8] |
|
| [9] |
Burgers A R, Eikelboom J A, Schonecker A, et al. Improved treatment of the strongly varying slope in fitting solar cell I–V curves. In: Proceedings of the 25th IEEE Photovoltaic Specialists Conference, Washington, USA, 1996, 569–572 |
| [10] |
Sinton R A, Verlinden P J, Crane R A, et al. Large-area 21% efficient Si solar cells. In: Proceedings of the 23rd IEEE Photovoltaic Specialists Conference, Louisville, USA, 1993, 157–161 |
| [11] |
|
| [12] |
|
| [13] |
|
| [14] |
|
| [15] |
|
| [16] |
|
| [17] |
|
| [18] |
|
| [19] |
|
| [20] |
|
| [21] |
|
| [22] |
|
| [23] |
|
| [24] |
|
| [25] |
|
| [26] |
|
| [27] |
|
| [28] |
|
| [29] |
|
| [30] |
|
| [31] |
|
| [32] |
|
| [33] |
|
| [34] |
|
| [35] |
|
| [36] |
|
| [37] |
|
| [38] |
|
| [39] |
|
| [40] |
|
| [41] |
|
| [42] |
|
| [43] |
|
| [44] |
|
| [45] |
|
| [46] |
|
| [47] |
|
| [48] |
|
Higher Education Press
Supplementary files
/
| 〈 |
|
〉 |