Analysis of air quality variability in Shanghai using AOD and API data in the recent decade
Qing ZHAO , Wei GAO , Weining XIANG , Runhe SHI , Chaoshun LIU , Tianyong ZHAI , Hung-lung Allen HUANG , Liam E. GUMLEY , Kathleen STRABALA
Front. Earth Sci. ›› 2013, Vol. 7 ›› Issue (2) : 159 -168.
Analysis of air quality variability in Shanghai using AOD and API data in the recent decade
We use the aerosol optical depth (AOD) measured by the moderate resolution imaging spectrometer (MODIS) onboard the Terra satellite, air pollution index (API) daily data measured by the Shanghai Environmental Monitoring Center (SEMC), and the ensemble empirical mode decomposition (EEMD) method to analyze the air quality variability in Shanghai in the recent decade. The results indicate that a trend with amplitude of 1.0 is a dominant component for the AOD variability in the recent decade. During the World Expo 2010, the average AOD level reduced 30% in comparison to the long-term trend. Two dominant annual components decreased 80% and 100%. This implies that the air quality in Shanghai was remarkably improved, and environmental initiatives and comprehensive actions for reducing air pollution are effective. AOD and API variability analysis results indicate that semi-annual and annual signals are dominant components implying that the monsoon weather is a dominant factor in modulating the AOD and API variability. The variability of AOD and API in selected districts located in both downtown and suburban areas shows similar trends; i.e., in 2000 the AOD began a monotonic increase, reached the maxima around 2006, then monotonically decreased to 2011 and from around 2006 the API started to decrease till 2011. This indicates that the air quality in the entire Shanghai area, whether urban or suburban areas, has remarkably been improved. The AOD improved degrees (IDS) in all the selected districts are (8.6±1.9)%, and API IDS are (9.2±7.1)%, ranging from a minimum value of 1.5% for Putuo District to a maximum value of 22% for Xuhui District.
air quality of Shanghai / MODIS AOD / API / EEMD method / World Expo 2010
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