Improving accuracy of automatic optical inspection with machine learning

Xinyu TONG, Ziao YU, Xiaohua TIAN, Houdong GE, Xinbing WANG

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PDF(5290 KB)
Front. Comput. Sci. ›› 2022, Vol. 16 ›› Issue (1) : 161310. DOI: 10.1007/s11704-021-0244-9
Artificial Intelligence
RESEARCH ARTICLE

Improving accuracy of automatic optical inspection with machine learning

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Abstract

Electronic devices require the printed circuit board (PCB) to support the whole structure, but the assembly of PCBs suffers from welding problem of the electronic components such as surface mounted devices (SMDs) resistors. The automated optical inspection (AOI) machine, widely used in industrial production, can take the image of PCBs and examine the welding issue. However, the AOI machine could commit false negative errors and dedicated technicians have to be employed to pick out those misjudged PCBs. This paper proposes a machine learning based method to improve the accuracy of AOI. In particular, we propose an adjacent pixel RGB value based method to pre-process the image from the AOI machine and build a customized deep learning model to classify the image. We present a practical scheme including two machine learning procedures to mitigate AOI errors.We conduct experiments with the real dataset from a production line for three months, the experimental results show that our method can reduce the rate of misjudgment from 0.3%–0.5% to 0.02%–0.03%, which is meaningful for thousands of PCBs each containing thousands of electronic components in practice.

Keywords

automated optical inspection / industrial internet of things / machine learning / image classification

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Xinyu TONG, Ziao YU, Xiaohua TIAN, Houdong GE, Xinbing WANG. Improving accuracy of automatic optical inspection with machine learning. Front. Comput. Sci., 2022, 16(1): 161310 https://doi.org/10.1007/s11704-021-0244-9

References

[1]
Blackwell G R. Electronic Systems Maintenance Handbook. 2nd ed. CRC Press, 2002
[2]
Huang X, Zhu S, Huang X, Su B, Ou C, Zhou W. Detection of plated through hole defects in printed circuit board with X-ray. In: Proceedings of the 16th IEEE Intnational Conferenceon on Electronic Packaging Technology. 2015, 1296–1301
CrossRef Google scholar
[3]
Alaoui N E B, Tounsi P, Boyer A, Viard A. Detecting PCB assembly defects using infrared thermal signatures. In: Proceedings of International Conference “Mixed Design of Integrated Circuits and Systems”. 2019, 345–349
[4]
Härter S, Klinger T, Franke J, Beer D. Comprehensive correlation of inline inspection data for the evaluation of defects in heterogeneous electronic assemblies. In: Proceedings of Pan Pacific Microelectronics Symposium. 2016, 1–6
CrossRef Google scholar
[5]
Wen K P, Wu W M, Huang C Y. Automatic optical inspection system and operating method thereof. U.S. Patent 10,438,340. 2019
[6]
Runji JM, Lin C. Automatic optical inspection aided augmented realitybased PCBA inspection: a development. In: Proceedings of IEEE Jordan International Joint Conference on Electrical Engineering and Information Technology. 2019, 667–671
CrossRef Google scholar
[7]
Wang W, Chen S, Chen L, Chang W. A machine vision based automatic optical inspection system for measuring drilling quality of printed circuit boards. IEEE Access, 2017, 5: 10817–10833
CrossRef Google scholar
[8]
Qiang G, Shanshan Z, Yang Z, Mao C. Detection method of PCB component based on automatic optical stitching algorithm. Circuit World, 2015, 41(4): 133–136
CrossRef Google scholar
[9]
Shorten C, Khoshgoftaar TM. A survey on image data augmentation for deep learning. Journal of Big Data, 2019, 6(1):1–48
CrossRef Google scholar
[10]
Lengerich B, Xing E P, Caruana R. On dropout, overfitting, and interaction effects in deep neural networks. 2020, arXiv preprint arXiv: 2007.00823
[11]
Liu X, Zhang J, Jiang S, Yang Y, Li K, Cao J, Liu J. Accurate localization of tagged objects using mobile RFID-augmented robots. IEEE Transactions on Mobile Computing, 2021, 20(4): 1273–1284
CrossRef Google scholar
[12]
Liu X, Chen S, Liu J, Qu W, Xiao F, Liu A X, Liu J. Fast and accurate detection of unknown tags for RFID systems-hash collisions are desirable. IEEE/ACM Transactions on Networking, 2020, 28(1):126–139
CrossRef Google scholar
[13]
Tong X, Liu K, Tian X, Fu L, Wang X. Fineloc: a fine-grained selfcalibrating wireless indoor localization system. IEEE Transactions on Mobile Computing, 2018, 18(9): 2077–2090
CrossRef Google scholar
[14]
Du T B, Shen G H, Huang Z Q, Yu Y S,Wu D X. Automatic traceability link recovery via active learning. Frontiers of Information Technology & Electronic Engineering, 2020, 21(8): 1–9
CrossRef Google scholar
[15]
Huang J H, Di X G, Chen A Y. A novel convolutional neural network method for crowd counting. Frontiers of Information Technology & Electronic Engineering, 2020, 21(8): 1150–1160
CrossRef Google scholar
[16]
Alreshidi E. Smart sustainable agriculture (SSA) solution underpinned by internet of things (IoT) and artificial intelligence (AI). 2019, arXiv preprint arXiv: 1906.03106
CrossRef Google scholar
[17]
Tzafestas S G. Synergy of IoT and AI in modern society: the robotics and automation case. Robotics & Automation Engineering Journal, 2018, 31(5): 1–15
CrossRef Google scholar
[18]
Xiao L, Wan X, Lu X, Zhang Y, Wu D. IoT security techniques based on machine learning: how do IoT devices use AI to enhance security? IEEE Signal Processing Magazine, 2018, 35(5): 41–49
CrossRef Google scholar
[19]
Meidan Y, Bohadana M, Shabtai A, Guarnizo J D, Ochoa M, Tippenhauer N O, Elovici Y. ProfilIoT: a machine learning approach for IoT device identification based on network traffic analysis. In: Proceedings of the Symposium on Applied Computing. 2017, 506–509
CrossRef Google scholar
[20]
Njima W, Ahriz I, Zayani R, Terre M, Bouallegueet R. Deep CNN for indoor localization in IoT-sensor systems. Journal of Sensors, 2019, 19(14): 3127–3132
CrossRef Google scholar
[21]
Canedo J, Skjellum A. Using machine learning to secure IoT systems. In: Proceedings of the 14th Annual Conference on Privacy, Security and Trust. 2016, 219–222
CrossRef Google scholar
[22]
Wang S, Tuor T, Salonidis T, Leung K K, Makaya C, He T, Chan K. When edge meets learning: adaptive control for resource-constrained distributed machine learning. In: Proceedings of the IEEE Conference on Computer Communications. 2018, 63–71
CrossRef Google scholar
[23]
Xiao L, Wan X, Lu X, Zhang Y, Wu D. IoT security techniques based on machine learning: how do IoT devices use AI to enhance security? IEEE Signal Processing Magazine, 2018, 35(5): 41–49
CrossRef Google scholar
[24]
Pramudita R, Hariadi F I. Development of techniques to determine object shifts for PCB board assembly automatic optical inspection. In: Proceedings of the International Symposium on Electronics and Smart Devices. 2018, 1–4
CrossRef Google scholar
[25]
Wu F, Li S, Zhao Y. A self-adaptive study method for multi-parameters thresholds in AOI system. In: Proceedings of the 11th World Congress on Intelligent Control and Automation. 2014, 5256–5259
CrossRef Google scholar
[26]
Jia X,Wang T, Li Y, Liu J, Zhang Y. AOI planning method based on genetic algorithm. In: Proceedings of International Conference on Mechatronics and Automation. 2019, 1801–1805
CrossRef Google scholar
[27]
Takacs T, Vajta L. Novel outlier filtering method for AOI image databases. IEEE Transactions on Components, Packaging and Manufacturing Technology, 2012, 2(4): 700–709
CrossRef Google scholar
[28]
Chaudhary V, Dave I R, Upla K P. Automatic visual inspection of printed circuit board for defect detection and classification. In: Proceedings of the International Conference on Wireless Communications, Signal Processing and Networking. 2017, 732–737
CrossRef Google scholar
[29]
Tsai J, Lin C, Chang C, Chou J. Optimized positional compensation parameters for exposure machine for flexible printed circuit board. IEEE Transactions on Industrial Informatics, 2015, 11(6): 1366–1377
CrossRef Google scholar
[30]
Mohammadi P, Wang Z J. Machine learning for quality prediction in abrasion-resistant material manufacturing process. In: Proceedings of the 2016 IEEE Canadian Conference on Electrical and Computer Engineering. 2016, 1–4
CrossRef Google scholar
[31]
Sartzetakis I, Christodoulopoulos K K, Varvarigos EM. Accurate quality of transmission estimation with machine learning. IEEE/OSA Journal of Optical Communications and Networking, 2019, 11(3): 140–150
CrossRef Google scholar
[32]
Von Enzberg S, Al-Hamadi A. A multiresolution approach to modelbased 3-D surface quality inspection. IEEE Transactions on Industrial Informatics, 2016, 12(4): 1498–1507
CrossRef Google scholar
[33]
Alonzo LM B, Chioson F B, Co H S, Bugtai N T, Baldovino R G. A machine learning approach for coconut sugar quality assessment and prediction. In: Proceedings of the 10th IEEE International Conference on Humanoid, Nanotechnology, Information Technology, Communication and Control, Environment and Management. 2018, 1–4
CrossRef Google scholar
[34]
Sultanow E, Ullrich A, Konopik S, Vladova G. Machine learning based static code analysis for software quality assurance. In: Proceedings of the 13th International Conference on Digital Information Management. 2018, 156–161
CrossRef Google scholar
[35]
Li X, Zhang W, Ding Q, Li X. Diagnosing rotating machines with weakly supervised data using deep transfer learning. IEEE Transactions on Industrial Informatics, 2019, 16(3): 1688–1697
CrossRef Google scholar

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