Impact of 1 064 nm continuous laser irradiation on the image quality of CCD image sensors

Cuiheng Zhang , Minghui Zuo , Pin Nie , Xiaoyong Zhu , Di Wang

Optoelectronics Letters ›› 2026, Vol. 22 ›› Issue (3) : 138 -142.

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Optoelectronics Letters ›› 2026, Vol. 22 ›› Issue (3) :138 -142. DOI: 10.1007/s11801-026-4243-9
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Impact of 1 064 nm continuous laser irradiation on the image quality of CCD image sensors
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Abstract

In order to thoroughly investigate the impact of lasers on the image quality of charge-coupled device (CCD) image sensors, this paper employs objective image quality assessment methods to study the damage effects of 1 064 nm continuous lasers on CCD image sensors at different power densities. Through a comprehensive analysis of grayscale distribution histograms, peak signal-to-noise ratio (PSNR) and structural similarity index measure (SSIM), the variations in image quality with increasing power density are revealed. The research results indicate that at low power density levels, the image quality decreases slowly; however, once the power density reaches a threshold, the image quality rapidly declines. When the image quality is severely damaged, the frequency of the main grayscale value drops to 0, and the degree of image damage saturates. Additionally, with the increase in power density, the dynamic range of the image first expands and then shrinks, eventually shifting towards the low grayscale value range.

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Cuiheng Zhang, Minghui Zuo, Pin Nie, Xiaoyong Zhu, Di Wang. Impact of 1 064 nm continuous laser irradiation on the image quality of CCD image sensors. Optoelectronics Letters, 2026, 22(3): 138-142 DOI:10.1007/s11801-026-4243-9

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