Analysis of scattering characteristics of coating materials through coupling of BRDF spectral polarization imaging with Torrance-Sparrow model

Feng Chen, Guibo Chen, Ye Zhang, Jianbo Wang, Yanli Liu, Fang Xue

Optoelectronics Letters ›› 2025, Vol. 21 ›› Issue (5) : 271-277.

Optoelectronics Letters ›› 2025, Vol. 21 ›› Issue (5) : 271-277. DOI: 10.1007/s11801-025-4046-4
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Analysis of scattering characteristics of coating materials through coupling of BRDF spectral polarization imaging with Torrance-Sparrow model

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Abstract

To identify coatings and analyze the anti-detection capabilities of camouflage patterns, material samples can be prepared using the super-pixel segmentation method. A spectral polarization imaging system is developed, based on the principle of bidirectional reflectance distribution function (BRDF), to obtain spectral reflection intensities of coatings at full spatial angles, and use polarization images to calculate the refractive index by the Fresnel equation. The index is then coupled into Torrance-Sparrow model to simulate the spectral scattering intensity to mutually verify the experimental results. The spectral scattering characteristics of standard camouflage patterns are then revealed and pinpoint the signature band and the angle of reflecting sensitivity.

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Feng Chen, Guibo Chen, Ye Zhang, Jianbo Wang, Yanli Liu, Fang Xue. Analysis of scattering characteristics of coating materials through coupling of BRDF spectral polarization imaging with Torrance-Sparrow model. Optoelectronics Letters, 2025, 21(5): 271‒277 https://doi.org/10.1007/s11801-025-4046-4

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