High Q reflection filter using a gradient-index membrane with a grating surface

Abstract

High Q reflection filter using a gradient-index (GI) membrane with a grating surface is proposed. The thickness of GI membrane is very small comparing with the traditional multilayer reflection filter or the GI reflection filter, and the GI membrane can also break the restriction of the resonant excitation condition of the conventional guided-mode resonance (GMR) filter. High Q filtering features can be maintained even on the high-index substrate. The grating thickness of the GI membrane filter can be used to select the resonance wavelength with different quality factors (QFs), the reflection peak is blue-shifted, and the QF is decreased from 554.4 to 207.8 as the grating thickness is increased from 50 nm to 150 nm. The gradient coefficient of the GI membrane filter can be used to tailor the number of the reflection channels. The resonant excitations of high order waveguide modes confined in the GI membrane are responsible for the high Q filtering properties with multiple channels.

References

[1] MacleodH. A.. Thin-Film Optical Filters, 2010, New York, CRC Press

[2] JiaoH. F., DingT., ChengX. B., MaB., HeP. F., WuY. G.. Chin. Opt. Lett., 2010, 8: 1102

[3] LiuC. C., ChangY. H., WuC. J.. J. Electromagn. Waves Appl., 2010, 24: 293

[4] ShankarA., KumarS.. J. Opt., 2014, 43: 257

[5] MaysmithT. C., SloyanK. A., GaziaR., EasonR. W.. Cryst. Growth Des., 2011, 11: 1098

[6] WangZ. S., BaoG. H., JiaoH. F., MaB., ZhangJ. L., DingT., ChengX. B.. Opt. Express, 2013, 21: 30623

[7] ChengX. B., FanB., DobrowolskiJ. A., WangL., WangZ. S.. Opt. Express, 2008, 16: 2315

[8] TangC. J., JaingC. C., LeeK. S., LeeC. C.. Appl. Opt., 2008, 47: C167

[9] RatsD., PoitrasD., SoroJ. M., MartinuL., StebutJ. V.. Surf. Coat. Technol., 1999, 111: 220

[10] LappschiesM., GörtzB., RistauD.. Appl. Opt., 2006, 45: 1502

[11] VerlyP. G.. Appl. Opt., 2008, 47: 172

[12] ZhangJ. C., FangM., JinY. X., HeH. B.. Thin Solid Films, 2012, 520: 5447

[13] SangT., CaiS. H., WangZ. S.. J. Mod. Opt., 2012, 58: 1260

[14] WangS. S., MagnussonR.. Appl. Opt., 1995, 34: 2414

[15] ZhongY., GoldenfeldZ., LiK., StreyerW., YuL., NordinL., MurphyN., WassermanD.. Opt. Lett., 2017, 42: 223

[16] IlyasS., BöckingT., KilianK., ReeceP. J., GoodingJ., GausK., GalM.. Opt. Mater., 2007, 29: 619

[17] OskooiA. F., RoundyD., IbanescuM., BermelP., JoannopoulosJ. D., JohnsonS. G.. Comput. Phys. Commum., 2010, 181: 687

[18] SangT., WangY. k., LiJ. L., ZhouJ. Y., JiangW. W., WangJ. C., ChenG. Q.. Opt. Commun., 2017, 382: 138

[19] WangQ., LiY., HuangT., WangJ. Y., ZhangD. W.. Microwave Opt. Technol. Lett., 2016, 58: 705

[20] DongY., SongY. F., MaL., GaoF. F.. Optoelectron. Lett., 2016, 12: 329

[21] RytovS. M.. Sov. Phys. JETP, 1956, 2: 2466

[22] BykovD. A., DoskolovichL. L.. Opt. Express, 2015, 23: 19234

[23] SangT., WangZ. S., WangL., WuY. G., ChenL. Y.. J. Opt. A: Pure Appl. Opt., 2006, 8: 62

[24] WangZ. S., SangT., ZhuJ. T., WangL., WuY. G., ChenL. Y.. Appl. Phys. Lett., 2006, 89: 241119

[25] HendrixK. D., HulseC. A., OckenfussG. J., SargentR. B.. Proc. SPIE, 2008, 7607: 706702

This work has been supported by the National Natural Science Foundation of China (No.11404143), the Fundamental Research Funds for the Central Universities (No.JUSRP115A15), and the Jiangsu Provincial Research Center of Light Industrial Optoelectronic Engineering and Technology (No.BM2014402).