Temperature characteristics of near infrared SPR sensors with Kretschmann configuration

Ying-hong Tian , Hong-yun Gao , Zi-wei Wu , Min Li

Optoelectronics Letters ›› : 191 -194.

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Optoelectronics Letters ›› : 191 -194. DOI: 10.1007/s11801-015-5030-1
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Temperature characteristics of near infrared SPR sensors with Kretschmann configuration

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Abstract

The temperature characteristics of near infrared surface plasmon resonance (SPR) sensors with Kretschmann configuration are studied theoretically and experimentally. The experimental results match with the numerical simulations in the temperature range from 10 °C to 40 °C. With the increase of temperature, the resonance angle for gas increases slightly, but that for aqueous solution decreases obviously. No matter the dielectric layer is gas or aqueous solution, the resonance peaks are both broadened.

Keywords

Surface Plasmon Resonance / Dielectric Layer / Local Surface Plasmon Resonance / Full Width Half Maximum / Silver Film

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Ying-hong Tian, Hong-yun Gao, Zi-wei Wu, Min Li. Temperature characteristics of near infrared SPR sensors with Kretschmann configuration. Optoelectronics Letters 191-194 DOI:10.1007/s11801-015-5030-1

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