Extraction of optimized parameters for Si0.6Ge0.4 material and SPP mode propagation through Si0.6Ge0.4/Ag/Si0.6Ge0.4 waveguide

Md. Ghulam Saber , Rakibul Hasan Sagor

Optoelectronics Letters ›› 2013, Vol. 9 ›› Issue (6) : 454 -457.

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Optoelectronics Letters ›› 2013, Vol. 9 ›› Issue (6) : 454 -457. DOI: 10.1007/s11801-013-3152-x
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Extraction of optimized parameters for Si0.6Ge0.4 material and SPP mode propagation through Si0.6Ge0.4/Ag/Si0.6Ge0.4 waveguide

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Abstract

The Lorentz model and modified Debye model (MDM) parameters for Si0.6Ge0.4 are presented. A nonlinear optimization algorithm is developed. The obtained parameters are used to determine the complex relative permittivity of Si0.6Ge0.4, and compared with the experimental data for validation. Finally the obtained parameters are used to analyze the properties of symmetric surface plasmon polariton (SPP) mode propagation in a dielectric-metal-dielectric (DMD) material constructed with silver (Ag) and Si0.6Ge0.4 for further verifying the extracted parameters.

Keywords

Root Mean Square / Electric Field Strength / Root Mean Square Deviation / Surface Plasmon Polariton / Surface Plasmon Polariton Mode

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Md. Ghulam Saber, Rakibul Hasan Sagor. Extraction of optimized parameters for Si0.6Ge0.4 material and SPP mode propagation through Si0.6Ge0.4/Ag/Si0.6Ge0.4 waveguide. Optoelectronics Letters, 2013, 9(6): 454-457 DOI:10.1007/s11801-013-3152-x

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