Fractal characteristics of far-field diffraction patterns for two-dimensional Thue-Morse quasicrystals

Abstract

We report a numerical method to analyze the fractal characteristics of far-field diffraction patterns for two-dimensional Thue-Morse (2-D TM) structures. The far-field diffraction patterns of the 2-D TM structures can be obtained by the numerical method, and they have a good agreement with the experimental ones. The analysis shows that the fractal characteristics of far-field diffraction patterns for the 2-D TM structures are determined by the inflation rule, which have potential applications in the design of optical diffraction devices.

Keywords

Intensity Distribution / Fractal Characteristic / Error Ratio / Input Plane / Random Defect

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