Fractal characteristics of far-field diffraction patterns for two-dimensional Thue-Morse quasicrystals
Ming-yang Yang, Jun Zhou, L. Petti, S. De Nicola, P. Mormile
Optoelectronics Letters ›› 2011, Vol. 7 ›› Issue (5) : 346-349.
Fractal characteristics of far-field diffraction patterns for two-dimensional Thue-Morse quasicrystals
We report a numerical method to analyze the fractal characteristics of far-field diffraction patterns for two-dimensional Thue-Morse (2-D TM) structures. The far-field diffraction patterns of the 2-D TM structures can be obtained by the numerical method, and they have a good agreement with the experimental ones. The analysis shows that the fractal characteristics of far-field diffraction patterns for the 2-D TM structures are determined by the inflation rule, which have potential applications in the design of optical diffraction devices.
Intensity Distribution / Fractal Characteristic / Error Ratio / Input Plane / Random Defect
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This work has been supported by the National Natural Science Foundation of China (No.60977048), the International Bilateral Italy-China Joint Projects (CNR/CAS Agreement 2008–2010), the International Collaboration Program of Ningbo (No.2010D10018) and the K. C. Wong Magna Fund in Ningbo University, China.
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