Discriminating optical parameters in double-layer turbid media by backscattered polarization patterns

Xin-miao Xu; Yu-lin Yang; Lan-qing Xu

doi:10.1007/s11801-011-0165-1

Optoelectronics Letters ›› 2011, Vol. 7 ›› Issue (3) : 233-236. DOI: 10.1007/s11801-011-0165-1

Article

Discriminating optical parameters in double-layer turbid media by backscattered polarization patterns

Xin-miao Xu¹^,³ ,
Yu-lin Yang²^,^b ,
Lan-qing Xu³

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Abstract

In this letter a Monte Carlo (MC) algorithm is used to simulate the propagation of polarized light in double-layer turbid media and the 2-dimentional backscattered Stokes vectors and Mueller matrices are obtained. Relationships between backscattered Mueller matrix and optical properties, such as scattering, absorption and layered structure, are discussed in detail. Integrating the 2-dimentional Mueller matrix elements along radial and azimuthal directions, we obtain a reverse trend with respect to the optical parameters for upper and lower layers, which suggests possibilities for discriminating subtle optical properties in a double-layer structure using backscattered polarization patterns such as Mueller matrix.

Keywords

Monte Carlo / Lower Layer / Optical Parameter / Azimuthal Direction / Turbid Medium

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Xin-miao Xu, Yu-lin Yang, Lan-qing Xu. Discriminating optical parameters in double-layer turbid media by backscattered polarization patterns. Optoelectronics Letters, 2011, 7(3): 233‒236 https://doi.org/10.1007/s11801-011-0165-1

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This work has been supported by the Governmental Education Bureau of Fujian Province(No.JA10068) and the 2009 Project for Scientific and Technical Development of Xiamen (No.3502Z20099007).