Influence of temperature on Auger recombination lifetime in In1−xGaxAs materials

Yu-chun Chang , Chang-xin Tian , Yan Ma , Jing-zhi Yin , Qiang Gao , Yi-ding Wang , Fu-bin Gao , Guo-tong Du

Optoelectronics Letters ›› 2010, Vol. 6 ›› Issue (1) : 31 -33.

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Optoelectronics Letters ›› 2010, Vol. 6 ›› Issue (1) : 31 -33. DOI: 10.1007/s11801-010-9188-2
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Influence of temperature on Auger recombination lifetime in In1−xGaxAs materials

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Abstract

The influence of temperature and Ga composition on Auger recombination lifetime in n-type and p-type In1−xGaxAs materials is investigated through the simulation, assuming the concentrations of electrons and holes are 1017 cm−3 and 1018 cm−3, respectively. The results show that the temperature has little influence on Auger recombination lifetime of In1−xGaxAs materials at x<0.3. However, it has a great impact when x>0.3 and the effect is more obvious at a lower temperature. Moreover, Auger recombination lifetime of p-type In1−xGaxAs is longer than that of n-type In1−xGaxAs with the same temperature, Ga composition and carriers concentration.

Keywords

Auger / Carrier Concentration / Gallium Arsenide / Auger Recombination / Light Hole

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Yu-chun Chang, Chang-xin Tian, Yan Ma, Jing-zhi Yin, Qiang Gao, Yi-ding Wang, Fu-bin Gao, Guo-tong Du. Influence of temperature on Auger recombination lifetime in In1−xGaxAs materials. Optoelectronics Letters, 2010, 6(1): 31-33 DOI:10.1007/s11801-010-9188-2

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