Fully differential optoelectronic integrated receiver implemented by 0.35 μm standard CMOS process

Abstract

A high-bandwidth, high-sensitivity fully differential optoelectronic integrated receiver is implemented in a chartered 3.3 V standard 0.35 μm analog CMOS process. To convert the incident light into a pair of fully differential photo-currents, a novel fully differential photodetector is proposed, which is composed of two completely identical photodiodes. The measurement results show that the receiver achieves a 1.11 GHz 3 dB bandwidth and a −13 dBm sensitivity for a 10⁻¹² bit error at 1.5 Gb/s data rate under illumination by 850 nm incident lights.

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