InAs/InAsSb Avalanche Photodiode (APD) for applicaions in long-wavelength infrared region

P. K. Maurya , H. Agarwal , A. Singh , P. Chakrabarti

Optoelectronics Letters ›› 2008, Vol. 4 ›› Issue (5) : 342 -346.

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Optoelectronics Letters ›› 2008, Vol. 4 ›› Issue (5) : 342 -346. DOI: 10.1007/s11801-008-8068-5
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InAs/InAsSb Avalanche Photodiode (APD) for applicaions in long-wavelength infrared region

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Abstract

A generic numerical model of a long-wavelength Avalanche Photodiode (APD) based on narrow bandgap semiconductor InAsSb on InAs substrate is reported for the first time. This model has been applied for theoretical characterization of a proposed N+ InAS/P-InAsSb avalanche photodiode structure for possible application in 2–5 μm wavelength region. The parameters such as gain, excess noise factor and their trade-off with variation of doping concentration and bias voltage have been estimated for the APD taking into account history-dependent theory of avalanche multiplication process. The LWIR APD is expected to find application in optical gas sensor and in future generation of optical communication system.

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P. K. Maurya, H. Agarwal, A. Singh, P. Chakrabarti. InAs/InAsSb Avalanche Photodiode (APD) for applicaions in long-wavelength infrared region. Optoelectronics Letters, 2008, 4(5): 342-346 DOI:10.1007/s11801-008-8068-5

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