Traceable long range scanning tunneling microscopy

A. Weckenmann; J. Hoffmann

doi:10.1007/s11801-008-7101-z

Optoelectronics Letters ›› 2008, Vol. 4 ›› Issue (1) : 49 -50. DOI: 10.1007/s11801-008-7101-z

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Traceable long range scanning tunneling microscopy

A. Weckenmann ¹^,^a
, J. Hoffmann ¹

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Abstract

Dimensionally correct and directly traceable measurement is not feasible with conventional scanning tunneling microscopy (STMs) due to severe hysteresis and non-linearity of the commonly applied piezo tube scanners and the very short range. By integrating a custom made probing system based on tunneling current measurement into a commercially available and laser-interferometrically position controlled positioning system, an STM with a principal measuring range of 25 mm × 25 mm × 5 mm and traceable position measurement has been set-up and tested.

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A. Weckenmann, J. Hoffmann. Traceable long range scanning tunneling microscopy. Optoelectronics Letters, 2008, 4(1): 49-50 DOI:10.1007/s11801-008-7101-z

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