Fabrication and characterization of NEMS

Ji-wei Jiao , Heng Yang , Tie Li , Xin-xin Li , Yue-lin Wang

Optoelectronics Letters ›› 2007, Vol. 3 ›› Issue (2) : 91 -94.

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Optoelectronics Letters ›› 2007, Vol. 3 ›› Issue (2) : 91 -94. DOI: 10.1007/s11801-007-7015-1
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Fabrication and characterization of NEMS

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We proposed a called “nano-fabrication based on MEMS technology” approach to realize the typical nano-electromechanical structures, such as integrated nano probe, ultrathin cantilever, silicon nano wire, and doubly clamped nano beam, to demonstrate the feasibility and advantages. We also introduced the characterization of nano structures based on laser vibrometer and piezoresistive effect, the latter method was first time applied to investigate a doubly daped nanobeam with a thickness of about 200 nm.

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Ji-wei Jiao, Heng Yang, Tie Li, Xin-xin Li, Yue-lin Wang. Fabrication and characterization of NEMS. Optoelectronics Letters, 2007, 3(2): 91-94 DOI:10.1007/s11801-007-7015-1

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