Analysis of principle deviation of subpixel Zernike moments operator

Ying-dong Qu, Rong-de Li, Xiao-guang Yuan, Hong-jun Huang, Chen-xi Li

Optoelectronics Letters ›› 2007, Vol. 3 ›› Issue (5) : 376-380.

Optoelectronics Letters ›› 2007, Vol. 3 ›› Issue (5) : 376-380. DOI: 10.1007/s11801-007-6161-9
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Analysis of principle deviation of subpixel Zernike moments operator

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Abstract

In original Zernike moments subpixel edge operator, ideal step edge model is chosen for calculating four parameters of a pixel point, and therefore principle deviation is caused by edge model. In order to discuss the effect of principle deviation on edge location, sampled edge model is chosen for calculating edge parameters, principle deviation of edge translation l is derived based on Zernike moments edge detection theory, and modified formula of l is given for Zernike moments operator with masks of 5 × 5 size. Both theory analysis and testing result demonstrate that principle deviation is zero when edge translation l is limited in central pixel of a sampled window. In another case, the modification of l should be considered, which results in edge location accuracy of non-subpixel level for this subpixel edge operator.

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Ying-dong Qu, Rong-de Li, Xiao-guang Yuan, Hong-jun Huang, Chen-xi Li. Analysis of principle deviation of subpixel Zernike moments operator. Optoelectronics Letters, 2007, 3(5): 376‒380 https://doi.org/10.1007/s11801-007-6161-9

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