Energy-dispersive X-ray Spectroscopy for the Quantitative Analysis of Pyrite Thin Specimens

Abstract

To explore ways to improve the accuracy of quantitative analysis of samples in the micrometer to nanometer range of magnitudes, we adopted analytical transmission electron microscopy (AEM/EDS) for qualitative and quantitative analysis of pyrite materials. Additionally, the k factor of pyrite is calculated experimentally. To develop an appropriate non-standard quantitative analysis model for pyrite materials, the experimentally calculated k factor is compared with that estimated from the non-standard quantitative analytical model of the instrument software. The experimental findings demonstrate that the EDS attached to a TEM can be employed for precise quantitative analysis of micro- and nanoscale regions of pyrite materials. Furthermore, it serves as a reference for improving the results of the EDS quantitative analysis of other sulfides.

Keywords

analytical transmission electron microscopy (AEM) / energy dispersive X-ray spectroscopy (EDS) / pyrite / thin specimen / quantitative analysis

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