Electrical and optical properties of nano aluminum film/particle structure

Abstract

The electrical and optical effects of particles on the nano aluminum film deposited by thermal evaporation was investigated. From the characterization results of scanning electron microscope (SEM), the accumulation in tens of nanometers had been observed. The current-voltage (I-V) curve of the sample indicates its nonlinear electrical characters expecting the corresponding nonlinear optical properties. By the theoretical calculation, nonlinear conduction of the carrier transportation may result from the barrier-well-barrier structure, where negative resistance and Coulomb blockade effect appears. The simulation results are approximately matched with the experimental results. By testing the fluorescence emission spectrum of the sample, peaks were found to be located at 420 and 440 nm. In addition, the full width at half maximum (FWHM) had been obviously broadened by means of adding 2, 5-diphenyloxazole (DPO). Therefore, discrete energy levels could be estimated inside those particles.

Keywords

nonlinear conduction properties / fluorescence emission / aluminum nano particle

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