Instantaneous creep in face-centered cubic metals at ultralow strain rates by a high-resolution strain measurement

Junjie Shen , Ikeda Kenichi , Hata Satoshi , Nakashima Hideharu

Journal of Wuhan University of Technology Materials Science Edition ›› 2013, Vol. 28 ›› Issue (6) : 1096 -1100.

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Journal of Wuhan University of Technology Materials Science Edition ›› 2013, Vol. 28 ›› Issue (6) : 1096 -1100. DOI: 10.1007/s11595-013-0826-y
Advanced Materials

Instantaneous creep in face-centered cubic metals at ultralow strain rates by a high-resolution strain measurement

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Abstract

Instantaneous creep in face-centered cubic metals, 5N Al (99.999%), 2N Al (99%) and 4N Cu (99.99%) with different grain sizes, was firstly investigated by sudden stress-change experiments at ultralow strain rates $\dot \varepsilon $ ⩽ 10−10 s−1 and temperature T < 0.32 T m. The experimental results indicate that the observed instantaneous creep is strongly dependent on grain size, the concentration of impurity, and stacking fault energy. Creep in high-purity aluminum, 5N Al, with a very large grain size, d g > 1600 μm, shows non-viscous behavior, and is controlled by the recovery of dislocations in the boundary of dislocation cells. On the other hand, for 5N Al with a small grain size, d g=30 μm, and low-purity aluminum, 2N Al, with d g= 25 μm, creep shows viscous behavior and may be related to ‘low temperature grain boundary sliding’. For high-purity copper, 4N Cu, with d g= 40 μm and lower stacking fault energy, creep shows a non-viscous behavior, and is controlled by the recovery process of dislocations. For all of the samples, creep shows anelastic behavior.

Keywords

face-centered cubic metals / instantaneous creep / ultra-low strain rate / high strain resolution measurement

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Junjie Shen, Ikeda Kenichi, Hata Satoshi, Nakashima Hideharu. Instantaneous creep in face-centered cubic metals at ultralow strain rates by a high-resolution strain measurement. Journal of Wuhan University of Technology Materials Science Edition, 2013, 28(6): 1096-1100 DOI:10.1007/s11595-013-0826-y

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