C-S-H cluster microstructure and bonding force investigation base on AFM technology

Bo Zhang; Zhen He; Haiyan Sun

doi:10.1007/s11595-010-0050-y

Journal of Wuhan University of Technology Materials Science Edition ›› 2010, Vol. 25 ›› Issue (4) : 592 -595. DOI: 10.1007/s11595-010-0050-y

Article

C-S-H cluster microstructure and bonding force investigation base on AFM technology

Bo Zhang ¹
, Zhen He ¹^,^{^b}
, Haiyan Sun ¹

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Abstract

AFM (atomic force microscopy) technology was applied on C-S-H (calcium silicate hydrate phase) microstructure investigation. The topographies of hydrated C3S (Tricalcium silicate) samples were firstly acquired with AFM. Accordingly, C-S-H can be identified according its pattern. Then the hydrated pssortland cement samples at different curing time were scanned with AFM. The topographies and force displacement curve were acquired and its characters at different days were summarized and analyzed. These results are very meaningful for C-S-H microstructure further investigation and cement-base material macro scale properties improvement.

Keywords

C-S-H / atomic force microscopy / microstructure / tricalcium silicate

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Bo Zhang, Zhen He, Haiyan Sun. C-S-H cluster microstructure and bonding force investigation base on AFM technology. Journal of Wuhan University of Technology Materials Science Edition, 2010, 25(4): 592-595 DOI:10.1007/s11595-010-0050-y

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