Banded spherulites grown from poly(trimethylene terephthalate) solution-cast film

Abstract

Various morphologies of poly(trimethylene terephthalate) (PTT) solution-cast thin films at different crystallization temperatures were investigated by polarized light microscopy (PLM), atomic force microscopy (AFM) and transmitted electron microscopy (TEM). In the range of 110–150 °C, banded spherulite occurred and banding space gradually decreased along the radial direction from the primary nucleation site. Between 160 and 170 °C, normal non-banded spherulite was found. Above 170 °C, banded configuration occurred again. Lamellar growth direction of banded spherulite was determined to the crystal a-axis.

Keywords

poly(trimethylene terephthalate) / crystallization / morphology / banded spherulite

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