Novel preparation and XPS analysis of V2O5 xerogel

Zhu Quan-yao; Chen Wen; Xu Qing; Mai Li-qiang

doi:10.1007/BF02838451

Journal of Wuhan University of Technology Materials Science Edition ›› 2003, Vol. 18 ›› Issue (3) : 27 -29. DOI: 10.1007/BF02838451

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Novel preparation and XPS analysis of V₂O₅ xerogel

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Abstract

The V₂O₅ sol was fabricated by ultra-fast quenching. The vanadium with low valence (V⁴⁺) was found in V₂O₅ xerogel films by XPS analysis. The technology of oxygen top-blown was applied to analyze the XPS spectrum difference of V₂O₅ xerogel when the powder of V₂O₅ was melting in air or in oxygen atmosphere. The results show that the different melting atmosphere has certain influences on the chemical valence of V₂O₅ xerogel.

Keywords

V₂O₅ xerogel films / melt quenching / oxygen top-blown / XPS

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Zhu Quan-yao, Chen Wen, Xu Qing, Mai Li-qiang. Novel preparation and XPS analysis of V₂O₅ xerogel. Journal of Wuhan University of Technology Materials Science Edition, 2003, 18(3): 27-29 DOI:10.1007/BF02838451

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