Modeling transmittance through submicron silver slit arrays

Ai-hua Wang , Jiu-ju Cai , Yu-bin Chen

Journal of Central South University ›› 2012, Vol. 19 ›› Issue (8) : 2107 -2114.

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Journal of Central South University ›› 2012, Vol. 19 ›› Issue (8) : 2107 -2114. DOI: 10.1007/s11771-012-1252-6
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Modeling transmittance through submicron silver slit arrays

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Abstract

Mid-infrared transmittance of submicron silver slit arrays was numerically studied with the finite difference time domain method. The slit width varies from 50 nm to 300 nm and a square feature may attach at either or both slit sides. Although the side length of features is one or two orders of magnitude shorter than the wavelength, the attached nanoscale features can modify the transmittance significantly. The transmittance was also further investigated in detail by looking into the electromagnetic fields and Poynting vectors of selected slit geometries. The investigation results show that such change can be attributed to the cavity resonance effect inside the slit arrays. The work is of great importance to the wavelength-selective devices design in optical devices and thermal application fields.

Keywords

finite difference time domain method / transmittance / silver slit array / cavity resonance effect

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Ai-hua Wang, Jiu-ju Cai, Yu-bin Chen. Modeling transmittance through submicron silver slit arrays. Journal of Central South University, 2012, 19(8): 2107-2114 DOI:10.1007/s11771-012-1252-6

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