Evaluation and Modeling of Long-Term Endurance Measurement on Electric Double Layer Capacitors to Increase Reliability of Lifetime Predictions

René Kalbitz

Intell. Sustain. Manuf. ›› 2025, Vol. 2 ›› Issue (2) : 10023

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Intell. Sustain. Manuf. ›› 2025, Vol. 2 ›› Issue (2) :10023 DOI: 10.70322/ism.2025.10023
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Evaluation and Modeling of Long-Term Endurance Measurement on Electric Double Layer Capacitors to Increase Reliability of Lifetime Predictions
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Abstract

Sustainability in the electrical industry and product reliability are fundamentally dependent on product lifetime predictions. Long-term DC voltage endurance measurements at two different temperatures on various commercial electric double-layer capacitors are presented, discussed, and used to develop a deterioration model suitable for estimating lifetime. Capacitors were tested under constant voltage for approximately 1 year at 65 °C and about 4 years at room temperature. To describe the deterioration in terms of capacitance and the equivalent series resistance, a phenomenological model is proposed and tested against measurements taken at room temperature. The proposed model is based on a general exponential relation with a time-dependent deterioration rate. The model is tested against long-term measurements with constant and time-dependent temperature acceleration factors. Analysis of capacitance and equivalent series resistance measurements shows a time or deterioration dependence in the temperature acceleration factor and different phases of deterioration.

Keywords

Electric double-layer capacitor / ECLC / Supercapacitor / Lifetime / Degradation / Long-term / Endurance / Modeling

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René Kalbitz. Evaluation and Modeling of Long-Term Endurance Measurement on Electric Double Layer Capacitors to Increase Reliability of Lifetime Predictions. Intell. Sustain. Manuf., 2025, 2(2): 10023 DOI:10.70322/ism.2025.10023

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Acknowledgments

This research would not have been possible without the technical expert Eric Fischer, and Jon Izkue-Rodriguez at the Würth Elektronik Competence Center Berlin, who provided technical support. Thanks to Jonas Bux and Philipp Mell from the University of Stuttgart for their valuable feedback.

Ethics Statement

Not applicable.

Informed Consent Statement

Not applicable.

Data Availability Statement

The raw digital data supporting the results of this study are available from the author upon reasonable request and are subject to a confidentiality agreement with Würth Elektronik eiSos GmbH. The raw digital data are the property of Würth Elektronik eiSos GmbH.

Funding

This research received no external funding.

Declaration of Competing Interest

The author declares that he has no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper.

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