Electrodeposition and characterization of thermoelectric Bi2Se3 thin films

Xiao-long Li , Ke-feng Cai , Hui Li , Ling Wang , Chi-wei Zhou

International Journal of Minerals, Metallurgy, and Materials ›› 2010, Vol. 17 ›› Issue (1) : 104 -107.

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International Journal of Minerals, Metallurgy, and Materials ›› 2010, Vol. 17 ›› Issue (1) : 104 -107. DOI: 10.1007/s12613-010-0118-x
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Electrodeposition and characterization of thermoelectric Bi2Se3 thin films

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Abstract

Bi2Se3 thin films were electrochemically deposited on Ti and indium tin oxide-coated glass substrates, respectively, at room temperature, using Bi(NO3)3·5H2O and SeO2 as starting materials in diluted HNO3 solution. A conventional three-electrode cell was used with a platinum sheet as a counter electrode, and a saturated calomel electrode was used as a reference electrode. The films were annealed in argon atmosphere. The influence of cold isostatic pressing before annealing on the microstructure and thermoelectric properties of the films was investigated. X-ray diffraction analysis indicates that the film grown on the indium tin oxide-coated glass substrate is pure rhombohedral Bi2Se3, and the film grown on the Ti substrate consists of both rhombohedral and orthorhombic Bi2Se3.

Keywords

thermoelectric thin films / bismuth selenide / electrodeposition / thermoelectric properties / cold isostatic pressing

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Xiao-long Li, Ke-feng Cai, Hui Li, Ling Wang, Chi-wei Zhou. Electrodeposition and characterization of thermoelectric Bi2Se3 thin films. International Journal of Minerals, Metallurgy, and Materials, 2010, 17(1): 104-107 DOI:10.1007/s12613-010-0118-x

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