Design of omnidirectional Rydberg atomic sensors loaded with electric field enhancement structure using characteristic mode analysis
Zhenke DING , Yi LIU , Bo WU , Kai YANG , Ruibing RAN , Yi LIN , Yunqi FU
Front. Inform. Technol. Electron. Eng ›› 2025, Vol. 26 ›› Issue (8) : 1461 -1472.
Design of omnidirectional Rydberg atomic sensors loaded with electric field enhancement structure using characteristic mode analysis
The integration of electric field enhancement structures (EFESs) with Rydberg atomic sensors (RASs) has garnered considerable interest due to their potential to enhance detection sensitivity in quantum measurement systems. Despite this, there is a dearth of research on the directional response of EFES, and the analysis of the three-dimensional (3D) patterns of RAS remains a formidable challenge. RASs are employed in non-destructive measurement techniques, and are responsive to electric fields, primarily serving as reception devices. However, analyzing their reception patterns is a complex task that requires a sophisticated approach. To address this, we adopt characteristic mode (CM) analysis to illustrate the omnidirectional performance of RAS. According to the CM theory, the reception pattern can be calculated by a series of modal currents and their corresponding coefficients. The analytical representation of these coefficients negates the need for time-consuming full-wave (FW) numerical simulations, which are typically required to generate EFES patterns due to the necessity of scanning numerous angle parameters. This approach significantly reduces the complexity of solving EFES patterns, and provides insightful guidance for the design process. To validate the efficacy of our proposed method, we construct three prototypes. The results indicate that the final model resonates at 1.96 GHz, achieving an electric field gain of 25 dB and an out-of-roundness of 2.4 dB. These findings underscore the effectiveness of our method in analyzing EFES patterns, highlighting its potential for future applications in the field.
Rydberg atomic sensor / Characteristic mode / Electric field enhancement structure
Zhejiang University Press
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